Patents by Inventor Wen-Miao Lo

Wen-Miao Lo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8105914
    Abstract: A method of fabricating an organic memory device is provided. In the method, a bottom electrode is formed on a substrate. A first surface treatment is performed on the bottom electrode to form a bottom surface treatment layer on a surface thereof. A polymer thin film is formed on the bottom surface treatment layer, and a top electrode is formed on the polymer thin film.
    Type: Grant
    Filed: May 14, 2009
    Date of Patent: January 31, 2012
    Assignee: Industrial Technology Research Institute
    Inventors: Chia-Chieh Chang, Zing-Way Pei, Wen-Miao Lo
  • Patent number: 7880213
    Abstract: A structure and a method of fabricating a bottom electrode of a metal-insulator-metal (MIM) capacitor are provided. First, a transition metal layer is formed on a substrate. Thereafter, a self-assembling polymer film having a nano-pattern is formed on the transition metal layer to expose a portion of the transition metal layer. Using the self-assembling polymer film as a mask, the exposed portion of the transition metal layer is treated to undergo a phase change so that the bottom electrode can achieve a nano-level of phase separation. Thereafter, the self-assembling polymer film is removed.
    Type: Grant
    Filed: May 15, 2006
    Date of Patent: February 1, 2011
    Assignee: Industrial Technology Research Institute
    Inventors: Wen-Miao Lo, Lurng-Sheng Lee, Pei-Ren Jeng, Cha-Hsin Lin, Ching-Chiun Wang
  • Publication number: 20090221113
    Abstract: A method of fabricating an organic memory device is provided. In the method, a bottom electrode is formed on a substrate. A first surface treatment is performed on the bottom electrode to form a bottom surface treatment layer on a surface thereof. A polymer thin film is formed on the bottom surface treatment layer, and a top electrode is formed on the polymer thin film.
    Type: Application
    Filed: May 14, 2009
    Publication date: September 3, 2009
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chia-Chieh Chang, Zing-Way Pei, Wen-Miao Lo
  • Publication number: 20070170420
    Abstract: An organic memory device includes a top electrode, a bottom electrode, and a bistable organic polymer layer between the top and bottom electrodes. Moreover, the organic memory device further includes a surface treatment layer between the organic polymer layer and the bottom electrode. Because the surface treatment layer can stabilize the interface between the organic polymer layer and the bottom electrode, the reliability of the device may be promoted.
    Type: Application
    Filed: July 31, 2006
    Publication date: July 26, 2007
    Inventors: Chia-Chieh Chang, Zing-Way Pei, Wen-Miao Lo
  • Publication number: 20070166911
    Abstract: A structure and a method of fabricating a bottom electrode of a metal-insulator-metal (MIM) capacitor are provided. First, a transition metal layer is formed on a substrate. Thereafter, a self-assembling polymer film having a nano-pattern is formed on the transition metal layer to expose a portion of the transition metal layer. Using the self-assembling polymer film as a mask, the exposed portion of the transition metal layer is treated to undergo a phase change so that the bottom electrode can achieve a nano-level of phase separation. Thereafter, the self-assembling polymer film is removed.
    Type: Application
    Filed: May 15, 2006
    Publication date: July 19, 2007
    Inventors: Wen-Miao Lo, Lurng-Sheng Lee, Pei-Ren Jeng, Cha-Hsin Lin, Ching-Chiun Wang
  • Publication number: 20070145525
    Abstract: A metal-insulator-insulator (MIM) capacitor structure is provided. The MIM capacitor includes a top electrode, a bottom electrode and a dielectric layer. The dielectric layer is disposed between the top electrode and the bottom electrode. The main feature for this kind of MIM capacitor is that the bottom electrode includes a conductive layer and a metal nitride with multi-layered structure. The metal nitride with multi-layered structure is disposed between the conductive layer and the dielectric layer. The nitrogen content in the metal nitride with multi-layered structure gradually increases toward the dielectric layer and the metal nitride belongs to the amorphous type. Due to the presence of the metal nitride, the dielectric layer is prevented from crystallization, thereby reducing the current leakage of the MIM capacitor.
    Type: Application
    Filed: August 11, 2006
    Publication date: June 28, 2007
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Ching-Chiun Wang, Cha-Hsin Lin, Wen-Miao Lo, Lurng-Shehng Lee