Abstract: A system for testing electronic device includes an electronic device, a temperature detecting module, a testing instrument and a testing computer. The testing electronic includes a main board and a power supply. The main board includes a slot and a card inserted in the slot. A plurality of dummy loads is located on the card. The slot includes at least one voltage interface. The power supply includes at least one power wire electrically connected to the at least one voltage interface. The temperature detecting module detects temperature signals of the plurality of dummy loads. The testing instrument is electrically connected to the at least one power wire to test current signals or power signals of the at least one power wire. The testing computer receives and displays the temperature signals, the current signals and the power signals.

Abstract: A system for testing electronic device includes an electronic device, a temperature detecting module, a testing instrument and a testing computer. The testing electronic includes a main board and a power supply. The main board includes a slot and a card inserted in the slot. A plurality of dummy loads is located on the card. The slot includes at least one voltage interface. The power supply includes at least one power wire electrically connected to the at least one voltage interface. The temperature detecting module detects temperature signals of the plurality of dummy loads. The testing instrument is electrically connected to the at least one power wire to test current signals or power signals of the at least one power wire. The testing computer receives and displays the temperature signals, the current signals and the power signals.

Abstract: A measuring device includes a bracket and a sliding ruler. The bracket includes a base and a first side plate. The sliding ruler is slidably attached to the bracket and includes a top wall and a first sidewall. The first side plate includes a first top surface, a first set of scale lines, and first scale values marking the first set of scale lines. The first scale values increase incrementally from the base to a scale value N at the first top surface. A distance between the first top surface and a bottom surface of the base is equal to the scale value N. The first sidewall includes second set of scale lines, and second scale values marking the second set of scale lines. The second scale values decrease incrementally from the base to the scale value N at the top wall.

Abstract: A measuring device includes a bracket, a sliding ruler, a securing assembly, and a driving assembly. The bracket includes a first set of scale lines. The sliding ruler is slidably attached to the bracket and includes a second set of scale lines. The securing assembly includes a securing member and a resilient member mounted to the securing member. The driving assembly is rotatably attached to the bracket and includes a handle and a gear secured to the handle. The gear is rotatable to slide the sliding ruler relative to the bracket; the securing member is secured to the bracket, and the resilient member is secured between the sliding ruler and the bracket, to prevent the sliding ruler from sliding relative to the bracket.

Abstract: A noise testing system includes an electronic device, a noise meter and a testing desk. The electronic device includes a plurality of separated electronic components. The noise meter is used to test a noise generated by the electronic device. The testing desk includes a surface. A plurality of scale markings is defined in the surface, and a plurality of scale value is labeled on the surface and correspond to the plurality of scale marking. A first distance between every two of the plurality of separated electronic components and a second distance between the noise meter and each of the plurality of separated electronic components is adjusted to be in a fixed range according to the plurality of scale marking. A noise testing method based upon the above noise testing system is further disclosed.