Patents by Inventor Wen-ping Hong

Wen-ping Hong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD FOR DETECTING DEFECTS ON WAFERS, SYSTEM FOR DETECTING DEFECTS ON WAFERS
    Publication number: 20240112323
    Abstract: A method for detecting defects on a wafer including the steps of obtaining a reference image of a chip pattern formed on a reference wafer, using a computer algorithm to analyze the reference image to produce a division map for the chip pattern; setting respective thresholds for divisions of the division map, obtaining a comparison data between a test image of the chip pattern formed on a test wafer and the reference image, using the division map and the thresholds to examine the comparison data to identify a defect in the test image.
    Type: Application
    Filed: November 17, 2022
    Publication date: April 4, 2024
    Applicant: United Semiconductor (Xiamen) Co., Ltd.
    Inventors: Yu Peng Hong, QINGRONG CHEN, Kai Ping Huang, Chin-Chun Huang, WEN YI TAN
  • Rest up apparatus for head rest
    Patent number: 5033138
    Abstract: The apparatus provides a device wherein the adjustable belt-like means is stretched over between two pole-like supports, and the head bearing area of the belt-like means can bear a head more evenly with a larger and generally spheric area.
    Type: Grant
    Filed: September 12, 1988
    Date of Patent: July 23, 1991
    Inventor: Wen-ping Hong