Patents by Inventor Wen-Ten Chen

Wen-Ten Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6672950
    Abstract: The present invention discloses a contamination prevention system and method of use having a contamination prevention shield that cooperates with a high pressure rinse apparatus to prevent contamination of particles within a CMP apparatus. The contamination prevention shield has a cleaning cup, two vertical side shields, a front vertical shield, and a floor that cooperate to prevent leakage of fluid splattered during a high pressure rinse of the CMP apparatus and an interior portion of a CMP apparatus housing; and a high pressure rinse apparatus connected to the contamination prevention shield having a conduit with at least one nozzle for dispensing cleaning fluid during a high pressure rinse cycle. Additionally, a plurality of contamination prevention shields may be used in combination with the high pressure rinse apparatus to further prevent contamination of an interior portion of the housing and the CMP apparatus.
    Type: Grant
    Filed: January 30, 2002
    Date of Patent: January 6, 2004
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Chih-I Peng, Wen-Ten Chen, Yu-Chia Chang, Yao-Hsiang Liang
  • Publication number: 20030143937
    Abstract: The present invention discloses a contamination prevention system and method of use having a contamination prevention shield that cooperates with a high pressure rinse apparatus to prevent contamination of particles within a CMP apparatus. The contamination prevention shield has a cleaning cup, two vertical side shields, a front vertical shield, and a floor that cooperate to prevent leakage of fluid splattered during a high pressure rinse of the CMP apparatus and an interior portion of a CMP apparatus housing; and a high pressure rinse apparatus connected to the contamination prevention shield having a conduit with at least one nozzle for dispensing cleaning fluid during a high pressure rinse cycle. Additionally, a plurality of contamination prevention shields may be used in combination with the high pressure rinse apparatus to further prevent contamination of an interior portion of the housing and the CMP apparatus.
    Type: Application
    Filed: January 30, 2002
    Publication date: July 31, 2003
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chih-I Peng, Wen-Ten Chen, Yu-Chia Chang, Yao-Hsiang Liang
  • Patent number: 6394886
    Abstract: A conformal disk holder for holding a rotating disk against a surface of a polishing pad is described. The conformal disk holder can be used for any polishing apparatus, but is particularly suited for use in a CMP pad conditioning disk. The conformal disk holder is constructed by a cover member, a flexural plate member and a base member. The flexural plate member has a center protrusion with a downwardly facing convex surface for intimately engaging an upwardly facing concave surface on a center protrusion of the base member. The intimate engagement between the convex surface and the concave surface allows at least a 5° tilt of the base member from a horizontal plane, and preferably allows a tilt between about 5° and about 30°.
    Type: Grant
    Filed: October 10, 2001
    Date of Patent: May 28, 2002
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd
    Inventors: Wen-Ten Chen, Yao-Hsiang Liang, Chih-I Peng, Yu-Chia Chang
  • Patent number: 6272902
    Abstract: A method for off-line testing a polishing head used in a CMP polishing apparatus is disclosed. The method utilizes at least two sets of pressurizing/vacuuming/venting devices for the independent testing of at least two fluid chambers which may include a membrane chamber, a retaining ring chamber and an innertube chamber normally found in a CMP polishing head. The present invention further discloses an off-line testing apparatus for a chemical mechanical polishing head which includes at least two independent sets of pressurizing/vacuuming/venting devices for testing a CMP head that is equipped with at least two fluid chambers such as a membrane chamber, a retaining ring chamber and an innertube chamber. The method and apparatus can be used advantageously for testing a variety of defects in a CMP polishing head prior to the installation of the head into a CMP apparatus. The defects include leakage between the fluid chambers, loss of vacuum seal in the fluid chambers, and binding between the fluid chambers.
    Type: Grant
    Filed: January 4, 1999
    Date of Patent: August 14, 2001
    Assignee: Taiwan Semiconductor Manufactoring Company, Ltd.
    Inventors: Wen-Ten Chen, Chung-Yang Lin, Fang-Lin Lu, Kau-Po Yeh
  • Patent number: 5925849
    Abstract: The present invention provides a floor mounted utility box that utilizes a cover member which can be easily installed by dropping in without any fastening means when in an installed position, the cover member is substantially flush with the floor level such that no tripping hazard is created by the cover. The cover is supported by at least two spaced apart supporting legs to provide a stabilizing effect for the cover.
    Type: Grant
    Filed: December 5, 1997
    Date of Patent: July 20, 1999
    Assignee: Taiwan Semiconductor Manufacturing Co. Ltd.
    Inventor: Wen-Ten Chen