Patents by Inventor Wen Wen Teng

Wen Wen Teng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8817246
    Abstract: A lens testing method is disclosed which comprises the following three steps. First, test a lens under test to obtain a testing characteristic value of the lens under test for a first object distance. Second, provide a correction datum. Third, calculate a simulated characteristic value for a second object distance according to the testing characteristic value and the correction datum.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: August 26, 2014
    Assignee: UMA Technologies Inc.
    Inventors: Chih Wei Tan, Wen Wen Teng
  • Publication number: 20130162983
    Abstract: A lens testing method is disclosed which comprises the following three steps. First, test a lens under test to obtain a testing characteristic value of the lens under test for a first object distance. Second, provide a correction datum. Third, calculate a simulated characteristic value for a second object distance according to the testing characteristic value and the correction datum.
    Type: Application
    Filed: August 6, 2012
    Publication date: June 27, 2013
    Inventors: CHIH WEI TAN, WEN WEN TENG
  • Patent number: 8169603
    Abstract: One embodiment of the invention provides a lens-testing apparatus being used for testing a lens device. The lens-testing apparatus comprises a light module, at least one first and second image sensors, and at least one image sensor module. The light module generates a patterned light beam passing the lens device. The first and second image sensors receive first and second portions of the patterned light beam; the first image sensor is disposed between the second image sensor and the lens device. The image sensor module receives a substantially parallel third portion of the patterned light beam, and comprises a third image sensor and a collimator. The third portion of the patterned light beam is focused onto the third image sensor by the collimator; the distance between the first image sensor and the lens device is smaller than the distance between the second image sensor and the lens device.
    Type: Grant
    Filed: August 14, 2009
    Date of Patent: May 1, 2012
    Assignee: UMA Technology Inc.
    Inventors: Chang Yuan Lee, Wen Wen Teng, Chungying Kuo
  • Patent number: 7869017
    Abstract: One embodiment of the invention provides an test apparatus having a plurality of combinations of object distances and being used for testing an optical device. The test apparatus comprises at least one reflector, at least one first target module and at least one second target module. The first target module is for forming a first patterned light beam being shed on the optical device. The second target module is for forming a second patterned light beam being reflected by the reflector and then shed on the optical device. The third target module is for forming a quasi-parallel third patterned light beam being shed on the optical device. The distance between the first target module and the optical device is smaller than the distance between the second target module and the optical device.
    Type: Grant
    Filed: August 14, 2009
    Date of Patent: January 11, 2011
    Assignee: UMA Technology Inc.
    Inventors: Chang Yuan Lee, Wen Wen Teng
  • Publication number: 20100165329
    Abstract: One embodiment of the invention provides a lens-testing apparatus being used for testing a lens device. The lens-testing apparatus comprises a light module, at least one first and second image sensors, and at least one image sensor module. The light module generates a patterned light beam passing the lens device. The first and second image sensors receive first and second portions of the patterned light beam; the first image sensor is disposed between the second image sensor and the lens device. The image sensor module receives a substantially parallel third portion of the patterned light beam, and comprises a third image sensor and a collimator. The third portion of the patterned light beam is focused onto the third image sensor by the collimator; the distance between the first image sensor and the lens device is smaller than the distance between the second image sensor and the lens device.
    Type: Application
    Filed: August 14, 2009
    Publication date: July 1, 2010
    Inventors: Chang Yuan LEE, Wen Wen Teng, Chungying Kuo
  • Publication number: 20100141962
    Abstract: One embodiment of the invention provides an test apparatus having a plurality of combinations of object distances and being used for testing an optical device. The test apparatus comprises at least one reflector, at least one first target module and at least one second target module. The first target module is for forming a first patterned light beam being shed on the optical device. The second target module is for forming a second patterned light beam being reflected by the reflector and then shed on the optical device. The third target module is for forming a quasi-parallel third patterned light beam being shed on the optical device. The distance between the first target module and the optical device is smaller than the distance between the second target module and the optical device.
    Type: Application
    Filed: August 14, 2009
    Publication date: June 10, 2010
    Inventors: Chang Yuan LEE, Wen Wen Teng