Abstract: A method and an apparatus are for monitoring the state of a device in process industries and a medium. The method includes: collecting and saving data of the multi-dimensional state of a device in the process industry; performing correlation analysis on the collected historical data of the multi-dimensional state of the device to obtain state dimensions having correlation; acquiring, according to the obtained state dimensions having correlation, historical data of the dimensional states having correlation, and modeling the acquired historical data of the dimensional states to obtain a device state reference model; acquiring real-time data of the dimensional states having correlation corresponding to the device state reference model in real time, and determining whether the current state of the device is normal according to a preset device state determination condition and the acquired real-time data of the dimensional states having correlation, and in combination with the device state reference model.