Abstract: Techniques are described for applying an edge sealant to the edge of a multi-layer optical device. In particular, embodiments provide an apparatus that performs a precision measurement of the perimeter of an eyepiece, applying the edge sealant (e.g., polymer) based on the precision-measured perimeter, and subsequently cures the edge sealant, using ultraviolet (UV) light that is directed at the edge sealant. The curing process may be performed within a short time following the application of the edge sealant, to ensure that any wicking of the edge sealant between the layers of the eyepiece is controlled to be no greater than a particular depth tolerance. In some examples, the edge sealant is applied to the optical device prevent, or at least reduce, the leakage of light from the optical device, and also to ensure and maintain the structure of the multi-layer optical device.

Abstract: Techniques are described for applying an edge sealant to the edge of a multi-layer optical device. In particular, embodiments provide an apparatus that performs a precision measurement of the perimeter of an eyepiece, applying the edge sealant (e.g., polymer) based on the precision-measured perimeter, and subsequently cures the edge sealant, using ultraviolet (UV) light that is directed at the edge sealant. The curing process may be performed within a short time following the application of the edge sealant, to ensure that any wicking of the edge sealant between the layers of the eyepiece is controlled to be no greater than a particular depth tolerance. In some examples, the edge sealant is applied to the optical device prevent, or at least reduce, the leakage of light from the optical device, and also to ensure and maintain the structure of the multi-layer optical device.

Abstract: Methods and systems for qualifying a multi-layered optical stack include providing the multi-layered optical stack including a first optical layer and a second optical layer. The first optical layer includes a first pair of fiducial marks and the second optical layer includes a second pair of fiducial marks Each of the first pair are spaced laterally from each of the second pair such that the first pair and the second pair are visible through the optical stack. A first angle defined between a first reference line connecting the first pair and a global reference line is determined. A second angle defined between a second reference line connecting the second pair and the global reference line is determined. The multi-layered optical stack is qualified for use in the optical projection system based on whether a difference between the first angle and the second angle is less than a predetermined threshold.

Abstract: Embodiments of the present disclosure are directed to an optical device, such as an eyepiece, including multiple layers of waveguides. The optical device can include an edge sealant for reducing light contamination, a lamination darn to restrict the wicking of the edge sealant between layers of the optical device, and venting gap (s) in the sealant and darn to allow air flow between the exterior and interior of the eyepiece. The gap(s) allow outgassing from the interior of the eyepiece of unreacted polymer and/or accumulated moisture, to prevent defect accumulation caused by chemical reaction of outgassed chemicals with the (e.g., ionic, acidic, etc.) surface of the eyepiece layers. The gap(s) also prevent pressure differences which may physically deform the eyepiece over time.

Abstract: Methods and systems for qualifying a multi-layered optical stack include providing the multi-layered optical stack including a first optical layer and a second optical layer. The first optical layer includes a first pair of fiducial marks and the second optical layer includes a second pair of fiducial marks Each of the first pair are spaced laterally from each of the second pair such that the first pair and the second pair are visible through the optical stack. A first angle defined between a first reference line connecting the first pair and a global reference line is determined. A second angle defined between a second reference line connecting the second pair and the global reference line is determined. The multi-layered optical stack is qualified for use in the optical projection system based on whether a difference between the first angle and the second angle is less than a predetermined threshold.

Abstract: Techniques are described for inspecting optical devices, such as eyepieces, to determine whether they exhibit light leakage through an edge sealant that has been applied to the device. Embodiments provide an inspection apparatus that can be employed to detect the leakage of light through an edge sealant of an optical device, where the edge sealant is applied to prevent, or at least reduce, the leakage of light from the optical device. Light from a light source is projected into the optical device. The light can travel along one or more wave guides within the device, until reaching an edge of the device. Light that is able to leak through an edge sealant can be reflected, using mirror(s) in the apparatus, and detected by a camera. Image(s) captured by the camera can be analyzed to determine the performance of the optical device with respect to edge leakage.

Abstract: Techniques are described for inspecting optical devices, such as eyepieces, to determine whether they exhibit light leakage through an edge sealant that has been applied to the device. Embodiments provide an inspection apparatus that can be employed to detect the leakage of light through an edge sealant of an optical device, where the edge sealant is applied to prevent, or at least reduce, the leakage of light from the optical device. Light from a light source is projected into the optical device. The light can travel along one or more wave guides within the device, until reaching an edge of the device. Light that is able to leak through an edge sealant can be reflected, using mirror(s) in the apparatus, and detected by a camera. Image(s) captured by the camera can be analyzed to determine the performance of the optical device with respect to edge leakage.

Abstract: Techniques are described for inspecting optical devices, such as eyepieces, to determine whether they exhibit light leakage through an edge sealant that has been applied to the device. Embodiments provide an inspection apparatus that can be employed to detect the leakage of light through an edge sealant of an optical device, where the edge sealant is applied to prevent, or at least reduce, the leakage of light from the optical device. Light from a light source is projected into the optical device. The light can travel along one or more wave guides within the device, until reaching an edge of the device. Light that is able to leak through an edge sealant can be reflected, using mirror(s) in the apparatus, and detected by a camera. Image(s) captured by the camera can be analyzed to determine the performance of the optical device with respect to edge leakage.

Abstract: Techniques are described for inspecting optical devices, such as eyepieces, to determine whether they exhibit light leakage through an edge sealant that has been applied to the device. Embodiments provide an inspection apparatus that can be employed to detect the leakage of light through an edge sealant of an optical device, where the edge sealant is applied to prevent, or at least reduce, the leakage of light from the optical device. Light from a light source is projected into the optical device. The light can travel along one or more wave guides within the device, until reaching an edge of the device. Light that is able to leak through an edge sealant can be reflected, using mirror(s) in the apparatus, and detected by a camera. Image(s) captured by the camera can be analyzed to determine the performance of the optical device with respect to edge leakage.

Abstract: Techniques are described for applying an edge sealant to the edge of a multi-layer optical device. In particular, embodiments provide an apparatus that performs a precision measurement of the perimeter of an eyepiece, applying the edge sealant (e.g., polymer) based on the precision-measured perimeter, and subsequently cures the edge sealant, using ultraviolet (UV) light that is directed at the edge sealant. The curing process may be performed within a short time following the application of the edge sealant, to ensure that any wicking of the edge sealant between the layers of the eyepiece is controlled to be no greater than a particular depth tolerance. In some examples, the edge sealant is applied to the optical device prevent, or at least reduce, the leakage of light from the optical device, and also to ensure and maintain the structure of the multi-layer optical device.