Patents by Inventor Weng Kwong

Weng Kwong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TEM sample preparation from a circuit layer structure
    Publication number: 20060243919
    Abstract: A method of TEM sample preparation from a circuit layer structure, the method comprising electron-beam assisted deposition of a first protective layer over a site of interest of the circuit layer structure; ion-beam assisted deposition of a second protective layer over the first protective layer; and ion-beam milling at the site of interest through the first and second protective layers.
    Type: Application
    Filed: April 27, 2005
    Publication date: November 2, 2006
    Applicant: SYSTEMS ON SILICON MANUFACTURING COMPANY PTE. LTD.
    Inventors: Wen Zhang, Weng Kwong