Patents by Inventor Weng Yee Kwong

Weng Yee Kwong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TEM sample preparation from a circuit layer structure
    Patent number: 7317188
    Abstract: A method of TEM sample preparation from a circuit layer structure, the method comprising electron-beam assisted deposition of a first protective layer over a site of interest of the circuit layer structure; ion-beam assisted deposition of a second protective layer over the first protective layer; and ion-beam milling at the site of interest through the first and second protective layers.
    Type: Grant
    Filed: April 27, 2005
    Date of Patent: January 8, 2008
    Assignee: Systems On Silicon Manufacturing Company Pte. Ltd.
    Inventors: Wen Yi Zhang, Weng Yee Kwong