Abstract: The present invention provides an array substrate, a display panel and a method for manufacturing the array substrate. The array substrate includes a substrate layer, a buffer layer, a mark layer and a thin film transistor layer, which are stacked. The buffer layer is disposed on the substrate layer and includes at least two stacked inorganic layers, stresses of which are mutually offset. The mark layer is disposed on one side of the buffer layer away from the substrate layer. The thin film transistor layer is disposed on the side of the buffer layer with the mark layer. The display panel includes the array substrate. The method for manufacturing the array substrate includes: providing a substrate, fabricating a substrate layer, fabricating a buffer layer and fabricating a thin film transistor layer.

Abstract: A method of extracting an image of a port wharf through multispectral interpretation includes: first, extracting a blurred coastline by assigning values to grayscale values; then, performing a smoothing and noise removal processing on a remote sensing image in a targeted area to extract edge information; sequentially, establishing a multispectral database of a targeted port wharf; and extracting a port wharf using a projected eigenvector, performing an MAF transformation on the regularized kernel function again, projecting multivariate observed values to original eigenvectors, and identifying a remote sensing image area corresponding to the original eigenvector smaller than a transformation variance as a port wharf to be extracted, and then carrying out a validation operation.

Abstract: A method of extracting an image of a port wharf through multispectral interpretation includes: first, extracting a blurred coastline by assigning values to grayscale values; then, performing a smoothing and noise removal processing on a remote sensing image in a targeted area to extract edge information; sequentially, establishing a multi spectral database of a targeted port wharf; and extracting a port wharf using a projected eigenvector, performing an MAF transformation on the regularized kernel function again, projecting multivariate observed values to original eigenvectors, and identifying a remote sensing image area corresponding to the original eigenvector smaller than a transformation variance as a port wharf to be extracted, and then carrying out a validation operation.