Abstract: The embodiments of the disclosure provide a sample analyzer and a liquid aspiration control method for a sample analyzer. When a liquid aspiration assembly is moving down toward a container, a signal acquisition and analysis assembly acquires and analyzes a first electrical signal; when the first electrical signal meets a first preset condition, the signal acquisition and analysis assembly acquires and analyzes a second electrical signal that is an electrical signal subsequent to the first electrical signal, and determines, according to at least the second electrical signal, whether the second electrical signal meets a second preset condition different from the first preset condition; and when the second electrical signal meets the second preset condition, the signal acquisition and analysis assembly sends information indicating that the liquid aspiration assembly reaches a surface of the liquid.

Abstract: An automatic analysis apparatus and an operating method for the automatic analysis apparatus. At least two magnetic separation units are introduced, each magnetic separation unit operating independently and being used for performing magnetic separation cleaning on a reaction solution in a reaction cup. Each magnetic separation unit may be used for any magnetic separation cleaning step in a one-step test project or a multi-step test project, thereby significantly increasing the test speed and the test throughput of the automatic analysis apparatus.

Abstract: An automatic analysis apparatus and an operating method for the automatic analysis apparatus. At least two magnetic separation units are introduced, each magnetic separation unit operating independently and being used for performing magnetic separation cleaning on a reaction solution in a reaction cup. Each magnetic separation unit may be used for any magnetic separation cleaning step in a one-step test project or a multi-step test project, thereby significantly increasing the test speed and the test throughput of the automatic analysis apparatus.

Abstract: An automatic analysis apparatus and an operating method therefor. A temporary storage portion is introduced, a multi-component test project may be divided into new one-step test processes, or a multi-step test process may be divided into new one-step test processes, and test sequences and processes may be re-entered, so that each mechanism, unit and control time sequence may be designed according to one-step test processes in a standard and orderly manner, so as to solve the problem that multi-component test projects and multi-step test processes disturb normal processes, thereby effectively increasing the test speed and the test throughput of the whole machine.

Abstract: An electronic device structure and an ultra-thin glass sheet used therein. The electronic device structure includes a functional device and an ultra-thin glass above the functional device. The ultra-thin glass has a thickness of no more than 0.4 mm and also has a toughening layer, of which the thickness does not exceed 50% of the thickness of the ultra-thin glass. The ultra-thin glass has a total thickness variation of no more than 20 ?m. The ultra-thin glass used in the electronic device structure according to the present invention provides quality assurance for subsequent potential processes, such as cutting, drilling, coating, screen-printing, laminating, gluing and the like, due to the toughening layer. Moreover, the ultra-thin glass improves functionality of the electronic device structure, in particular of the device, due to its small total thickness variation.

Abstract: An electronic device structure and an ultra-thin glass sheet used therein. The electronic device structure includes a functional device and an ultra-thin glass above the functional device. The ultra-thin glass has a thickness of no more than 0.4 mm and also has a toughening layer, of which the thickness does not exceed 50% of the thickness of the ultra-thin glass. The ultra-thin glass has a total thickness variation of no more than 20 ?m. The ultra-thin glass used in the electronic device structure according to the present invention provides quality assurance for subsequent potential processes, such as cutting, drilling, coating, screen-printing, laminating, gluing and the like, due to the toughening layer. Moreover, the ultra-thin glass improves functionality of the electronic device structure, in particular of the device, due to its small total thickness variation.