Abstract: For each circuit element in a pair of launch and capture paths, a parameter value of the circuit element may be modified by a variation amount that is assigned to a class of circuit elements to which the circuit element belongs. Next, a timing slack may be computed for the pair of launch and capture paths.

Abstract: Various embodiments of a method and apparatus for determining parametric timing yield and bottlenecks are disclosed which take into account correlation between electrical circuit paths through common timing arcs of an integrated circuit chip under design. Monte Carlo samples of timing arc delays are generated and used in computing timing yield and identify yield bottlenecks.

Abstract: For each circuit element in a pair of launch and capture paths, a parameter value of the circuit element may be modified by a variation amount that is assigned to a class of circuit elements to which the circuit element belongs. Next, a timing slack may be computed for the pair of launch and capture paths.

Abstract: Embodiments provide for mitigating parametric yield loss of an integrated circuit (IC) design. In certain embodiments, a delay distribution associated with at least one cell disposed in the design is determined. A pin slack distribution associated with paths in which the at least one cell is disposed is determined. A residual distribution is determined based at least in part on the delay distribution and the pin slack distribution. Yield loss associated with the at least one cell is determined based at least in part on the delay distribution and the residual distribution. When it is determined that that the yield loss associated with the at least one cell exceeds a yield loss threshold, the at least one cell may be identified as a candidate for replacement with a replacement cell.