Patents by Inventor Wenwen HAO

Wenwen HAO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250068984
    Abstract: A method for operating a storage device and the storage device are provided. The method includes obtaining an initial failure warning model comprising a plurality of decision trees, the obtaining the initial failure warning model including being trained with a random forest algorithm based on historical failure related data, the historical failure related data comprising historical multiple operational attributes data of the storage device and failure logs of the storage device, determining high frequency decision nodes in the plurality of decision trees, the high frequency decision nodes being similar single-nodes with at least a first number in the plurality of decision trees, the similar single-nodes being single-nodes having a same monitoring attribute, a same attribute determination symbol, and a difference between attribute thresholds within a first range, and constructing the failure warning model of a new decision tree comprising the high frequency decision nodes.
    Type: Application
    Filed: February 22, 2024
    Publication date: February 27, 2025
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Yuqi ZHANG, Shuyang WANG, Wenwen HAO, Yongwong KWON, Chankyu KOH
  • Patent number: 11994934
    Abstract: A failure prediction method and device for a storage device are provided. The method comprises: inputting SMART data of the storage device obtained in real time into each of a plurality of base classification models to obtain a classification result for the SMART data of the storage device obtained in real time that is output by the each classification model, wherein the each base classification model is obtained by training using historical SMART data of a plurality of storage devices and/or SMART data of the plurality of storage devices obtained online; determining whether the SMART data of the storage device obtained in real time is healthy data or erroneous data, based on classification results of the plurality of base classification models; predicting whether the storage device will fail, based on a number of SMART data that is determined as healthy data and a number of SMART data that is determined as erroneous data among SMART data of the storage device obtained within a predetermined time window.
    Type: Grant
    Filed: July 18, 2022
    Date of Patent: May 28, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Wenwen Hao, Yongwong Kwon, Na Liu, Yin Luo, Chankyu Koh, Lining Dou, Lu Wang, Young-Seop Shim
  • Publication number: 20240160511
    Abstract: A failure prediction apparatus and method for storage devices are provided, the method including: obtaining attribute information of a plurality of attributes for a plurality of storage devices during operation of a storage apparatus; obtaining global attribute information for each of the plurality of storage devices based on the attribute information of the plurality of attributes obtained within a first time window before the current time; and predicting failures for the plurality of storage devices using a trained machine-learning model based on attribute information of the plurality of attributes of each of the plurality of storage devices obtained within a second time window before the current time and the global attribute information of each of the plurality of storage devices.
    Type: Application
    Filed: August 17, 2023
    Publication date: May 16, 2024
    Inventors: Wenwen HAO, Yuqi ZHANG, Chankyu KOH, Yongwong KWON
  • Publication number: 20230141749
    Abstract: A failure prediction method and device for a storage device are provided. The method comprises: inputting SMART data of the storage device obtained in real time into each of a plurality of base classification models to obtain a classification result for the SMART data of the storage device obtained in real time that is output by the each classification model, wherein the each base classification model is obtained by training using historical SMART data of a plurality of storage devices and/or SMART data of the plurality of storage devices obtained online; determining whether the SMART data of the storage device obtained in real time is healthy data or erroneous data, based on classification results of the plurality of base classification models; predicting whether the storage device will fail, based on a number of SMART data that is determined as healthy data and a number of SMART data that is determined as erroneous data among SMART data of the storage device obtained within a predetermined time window.
    Type: Application
    Filed: July 18, 2022
    Publication date: May 11, 2023
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Wenwen HAO, YONGWONG KWON, Na LIU, Yin LUO, CHANKYU KOH, Lining DOU, Lu WANG, YOUNG-SEOP SHIM