Patents by Inventor WEN-WEN ZHOU

WEN-WEN ZHOU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuit board testing device and method thereof
    Patent number: 10852345
    Abstract: A circuit board testing device electrically coupled to a measurement gauge tests a circuit board. The circuit board testing device includes a processor configured to configure measurement parameters of the measurement gauge, configure measurement rules for testing the circuit board, confirm a circuit of the circuit board to be tested according to the record of test data, control the measurement gauge to test the circuit of the circuit board to be tested when the measurement gauge is electrically coupled to the circuit of the circuit board to be tested, receive measurement data returned by the measurement gauge, and analyze a faulty region of the circuit board according to the record of test data and the measurement data.
    Type: Grant
    Filed: November 29, 2018
    Date of Patent: December 1, 2020
    Assignees: HONGFUJIN PRECISION ELECTRONICS (CHENGDU) Co., Ltd., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Qiang Liu, Wen-Wen Zhou, Meng Wang, Zi-Qing Xia, Zhi-Gao Wu
  • CIRCUIT BOARD TESTING DEVICE AND METHOD THEREOF
    Publication number: 20200103461
    Abstract: A circuit board testing device electrically coupled to a measurement gauge tests a circuit board. The circuit board testing device includes a processor configured to configure measurement parameters of the measurement gauge, configure measurement rules for testing the circuit board, confirm a circuit of the circuit board to be tested according to the record of test data, control the measurement gauge to test the circuit of the circuit board to be tested when the measurement gauge is electrically coupled to the circuit of the circuit board to be tested, receive measurement data returned by the measurement gauge, and analyze a faulty region of the circuit board according to the record of test data and the measurement data.
    Type: Application
    Filed: November 29, 2018
    Publication date: April 2, 2020
    Inventors: QIANG LIU, WEN-WEN ZHOU, MENG WANG, ZI-QING XIA, ZHI-GAO WU