Patents by Inventor Wenye LIU

Wenye LIU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12047519
    Abstract: Methods and endpoint nodes and controllers are disclosed for mutual authentication and key exchange. In an embodiment, physical unclonable function circuits on the endpoint nodes are used in combination with key masks to allow mutual authentication and key exchange between the endpoint nodes.
    Type: Grant
    Filed: July 15, 2022
    Date of Patent: July 23, 2024
    Assignee: Nanyang Technological University
    Inventors: Yue Zheng, Chip Hong Chang, Wenye Liu
  • Publication number: 20230032099
    Abstract: Methods and endpoint nodes and controllers are disclosed for mutual authentication and key exchange. In an embodiment, physical unclonable function circuits on the endpoint nodes are used in combination with key masks to allow mutual authentication and key exchange between the endpoint nodes.
    Type: Application
    Filed: July 15, 2022
    Publication date: February 2, 2023
    Inventors: Yue ZHENG, Chip Hong CHANG, Wenye LIU
  • Publication number: 20180284181
    Abstract: Disclosed are an on-line health management device and an on-line health management method for an insulated gate bipolar transistor. The device comprises: an electrothermal detection module, configured to detect a junction temperature and a temperature rise of the insulated gate bipolar transistor based on operating condition parameters of the insulated gate bipolar transistor in combination with a structure of the insulated gate bipolar transistor; a degradation detection module, configured to detect a performance degradation degree of the insulated gate bipolar transistor based on the operating condition parameters, the structure, the junction temperature and the temperature rise of the insulated gate bipolar transistor; and a lifetime detection module, configured to detect a consumed lifetime of the insulated gate bipolar transistor based on the performance degradation degree thereof.
    Type: Application
    Filed: November 1, 2016
    Publication date: October 4, 2018
    Applicant: CRRC Zhuzhou Institute Co., Ltd.
    Inventors: Wenye LIU, Jinfeng YANG, Jiaxi HU, Yanyong LI, Jianbo LUO, Hangjie FU