Patents by Inventor Wenzhi WANG
Wenzhi WANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240138424Abstract: A tortoise electric slaughtering device includes an electric slaughtering box, an end of the box is disposed with an outlet, a bottom wall of another end thereof is disposed with a concave area, and a discharging plate is mounted at the outlet. The box is supported on a ground through a frame, and a bottom of the box and an upper surface of the frame have a gap therebetween. A driving wheel rotatably disposed between side walls at one end of the box, a driven wheel rotatably mounted on an end of the frame away from the driving wheel, deflector rollers mounted in a slope direction between side walls of the box at the concave area, and a guiding roller mounted on the box and near the driven wheel, are connected through a conveyer belt. A clamping device is mounted on the box and mounted with a cutting device.Type: ApplicationFiled: October 27, 2023Publication date: May 2, 2024Inventors: Wenzhi Wei, Chunyu Chen, Zhengcheng Wang
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Publication number: 20240088069Abstract: Disclosed herein are integrated circuit (IC) supports with microstrips, and related embodiments. For example, an IC support may include a plurality of microstrips and a plurality of conductive segments. Individual ones of the conductive segments may be at least partially over at least two microstrips, a dielectric material may be between the plurality of microstrips and the plurality of conductive segments, and the conductive segments are included in a tape.Type: ApplicationFiled: February 26, 2021Publication date: March 14, 2024Applicant: Intel CorporationInventors: Wenzhi Wang, Xiaoning Ye, Yunhui Chu, Chunfei Ye, James A. McCall
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Publication number: 20240063134Abstract: Disclosed herein are integrated circuit (IC) supports with microstrips, and related embodiments. For example, an IC support may include a plurality of microstrips and a plurality of conductive segments. Individual ones of the conductive segments may be at least partially over at least two microstrips, a dielectric material may be between the plurality of microstrips and the plurality of conductive segments, and an individual conductive segment may have a conductivity that is close to or less than a conductivity of a conductive line of an individual microstrip.Type: ApplicationFiled: February 26, 2021Publication date: February 22, 2024Applicant: Intel CorporationInventors: Xiaoning Ye, Pooya Tadayon, Wenzhi Wang, Srinivasa R. Aravamudhan, Nathan Somnang Tan, Brett Daniel Grossman
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Publication number: 20240061738Abstract: A log output method and system for a server, and a computer-readable storage system and a server. The method includes: after a server is powered on, determining whether a debugging switch in BIOS settings of the server is enabled (S101); if so, initializing a serial port function and making a debugging function take effect (S102); reading a printing function value in the debugging function (S103); if the printing function value is a first preset value, printing log information by means of the serial port function (S104); and if the printing function value is a second preset value, turning off a log output function (S105). The method is conducive to quickly locating a fault abnormality of a server, thereby reducing the server debugging and modification time.Type: ApplicationFiled: October 29, 2021Publication date: February 22, 2024Inventors: Wenzhi WANG, Yingshu ZHU, Anping WANG, Shuai HUANG, Fengbing CAO, Shengnan LIANG
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Patent number: 11875503Abstract: A method and a system for measuring morphological parameters of an intracranial aneurysm image, the method comprises: segmenting an intracranial parent artery image from three-dimensional DICOM data of DSA (S101); segmenting the intracranial aneurysm image on the intracranial aneurysm image (S102); and measuring morphological parameters of the intracranial aneurysm image (S103). The method and the system for measuring the morphological parameters of the intracranial aneurysm image as disclosed may implement automated measurement of the intracranial aneurysm image, quickly measure morphological parameters of the intracranial aneurysm image, and guarantee consistency between measurements of morphological parameters of the aneurysm image.Type: GrantFiled: October 25, 2019Date of Patent: January 16, 2024Assignee: UNION STRONG (BEIJING) TECHNOLOGY CO. LTD.Inventors: Guangming Yang, Wenzhi Wang, Xue Feng, Ling Song, Lan Qin
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Publication number: 20230214669Abstract: Decision feedback equalization (DFE) training time in a memory device is reduced through the use of a hybrid search to select values of tap coefficients for taps in the DFE. The hybrid search includes two searches. A first search is performed to identify initial values of tap coefficients, a second search uses the initial values of tap coefficients to find the final values of tap coefficients.Type: ApplicationFiled: March 13, 2023Publication date: July 6, 2023Inventors: Wenzhi WANG, Yunhui CHU, James A. McCALL, Chunfei YE, Tonia M. ROSE, Caroline GRIMES
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Patent number: 11378548Abstract: A device and a method for testing a steel defect based on internal and external magnetic perturbation. The device includes: a magnetizer comprising a magnetization source and a magnet yoke, arranged on a surface of a sample, and configured to generate two types of typical magnetic field regions applied to testing based on internal and external magnetic perturbation; a double-row magnetic sensor probe, configured to collect internal and external magnetic perturbation data; a master controller, configured to perform pre-processing on the internal and external magnetic perturbation data, and store the pre-processed data; scanner wheels, configured to generate a sampling trigger pulse during scanning to enable the master controller to receive the internal and external magnetic perturbation data from the probes; and a host computer, configured to analyze the pre-processed data uploaded by the master controller to obtain a defect quantitative result.Type: GrantFiled: January 12, 2021Date of Patent: July 5, 2022Assignee: TSINGHUA UNIVERSITYInventors: Songling Huang, Wenzhi Wang, Wei Zhao, Shen Wang, Zijing Huang, Xiaochun Song, Lisha Peng
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Publication number: 20210396711Abstract: The present disclosure provides a device and a method for testing a steel defect based on internal and external magnetic perturbation. The device includes: a magnetizer comprising a magnetization source and a magnet yoke, arranged on a surface of a sample, and configured to generate two types of typical magnetic field regions applied to testing based on internal and external magnetic perturbation; a double-row magnetic sensor probe, configured to collect internal and external magnetic perturbation data; a master controller, configured to perform pre-processing on the internal and external magnetic perturbation data, and store the pre-processed data; scanner wheels, configured to generate a sampling trigger pulse during scanning to enable the master controller to receive the internal and external magnetic perturbation data from the probes; and a host computer, configured to analyze the pre-processed data uploaded by the master controller to obtain a defect quantitative result.Type: ApplicationFiled: January 12, 2021Publication date: December 23, 2021Inventors: Songling HUANG, Wenzhi WANG, Wei ZHAO, Shen WANG, Zijing HUANG, Xiaochun SONG, Lisha PENG
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Patent number: 11183128Abstract: A liquid crystal display and a display calibration method thereof are provided. The display calibration method includes the following steps. A liquid crystal display panel is driven by a driving circuit to display an image. A light-emitting diode backlight module is driven by the driving circuit to provide a backlight to the liquid crystal display panel, wherein the driving circuit determines at least one illuminating time of the light-emitting diode backlight module according to a response time of the liquid crystal display panel and a writing period of at least one target display area of the liquid crystal display panel.Type: GrantFiled: May 5, 2020Date of Patent: November 23, 2021Assignee: Wistron CorporationInventors: Yueqi Xu, Chih-Chou Chou, Junxin Qiu, Yongqiang Li, Wenzhi Wang
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Patent number: 11150311Abstract: A device and a method for detecting a defect contour with omnidirectionally equal sensitivity based on magnetic excitation are provided. The device includes a magnetic sensor array arranged in a spatially uniform magnetic field and configured to collect a magnetic field signal, and a data analysis module configured to analyze the magnetic field signal, extract a distorted magnetic field signal, and obtain an image of the defect contour based on the distorted magnetic field signal.Type: GrantFiled: June 17, 2020Date of Patent: October 19, 2021Assignee: TSINGHUA UNIVERSITYInventors: Songling Huang, Wenzhi Wang, Lisha Peng, Wei Zhao, Shen Wang, Zijing Huang
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Publication number: 20210319147Abstract: The present invention relates to an ultrathin omnidirectional vibration-isolation metasurface structure and a design method thereof. The omnidirectional vibration-isolation metasurface structure includes a flat plate and a vibration isolation metasurface structure arranged on the flat plate. The vibration isolation metasurface structure is designed in any closed shape according to the shape and position of a vibration source. The vibration isolation metasurface structure is composed of periodically arranged supercells. Each supercell includes j unit cells with a gradient index. The unit cell is in a zigzag shape. The total reflection of elastic waves at any incident angle is realized by designing an elastic wave metasurface with a sub-wavelength thickness in the present invention, so that a vibration isolation purpose is achieved.Type: ApplicationFiled: June 17, 2021Publication date: October 14, 2021Inventors: Bing Li, Yabin Hu, Heyuan Huang, Wenzhi Wang, Chi Hou, Meiying Zhao, Xiaopeng Wan, Yixin Xu
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Publication number: 20210272526Abstract: A liquid crystal display and a display calibration method thereof are provided. The display calibration method includes the following steps. A liquid crystal display panel is driven by a driving circuit to display an image. A light-emitting diode backlight module is driven by the driving circuit to provide a backlight to the liquid crystal display panel, wherein the driving circuit determines at least one illuminating time of the light-emitting diode backlight module according to a response time of the liquid crystal display panel and a writing period of at least one target display area of the liquid crystal display panel.Type: ApplicationFiled: May 5, 2020Publication date: September 2, 2021Applicant: Wistron CorporationInventors: Yueqi Xu, Chih-Chou Chou, Junxin Qiu, Yongqiang Li, Wenzhi Wang
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Publication number: 20210272274Abstract: A method and a system for measuring morphological parameters of an intracranial aneurysm image, the method comprises: segmenting an intracranial parent artery image from three-dimensional DICOM data of DSA (S101); segmenting the intracranial aneurysm image on the intracranial aneurysm image (S102); and measuring morphological parameters of the intracranial aneurysm image (S103). The method and the system for measuring the morphological parameters of the intracranial aneurysm image as disclosed may implement automated measurement of the intracranial aneurysm image, quickly measure morphological parameters of the intracranial aneurysm image, and guarantee consistency between measurements of morphological parameters of the aneurysm image.Type: ApplicationFiled: October 25, 2019Publication date: September 2, 2021Inventors: Guangming YANG, Wenzhi WANG, Xue FENG, Ling SONG, Lan QIN
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Publication number: 20210181270Abstract: A device and a method for detecting a defect contour with omnidirectionally equal sensitivity based on magnetic excitation are provided. The device includes a magnetic sensor array arranged in a spatially uniform magnetic field and configured to collect a magnetic field signal, and a data analysis module configured to analyze the magnetic field signal, extract a distorted magnetic field signal, and obtain an image of the defect contour based on the distorted magnetic field signal.Type: ApplicationFiled: June 17, 2020Publication date: June 17, 2021Inventors: Songling HUANG, Wenzhi WANG, Lisha PENG, Wei ZHAO, Shen WANG, Zijing HUANG