Abstract: A work piece is measured by at least one point of a surface of the work piece being sampled by a feeler. The feeler exerts a probing force on the surface and the feeler is deflected relative to a mounting of the feeler. On the basis of the deflection, a position of the point of the surface is determined. A directional dependence of a flexibility of the feeler is determined and/or is known. The feeler and the work piece are positioned and/or oriented relative to each other, while taking into consideration the directional dependence, such that during sampling of the point of the surface unintentional slipping of the feeler on the surface does not occur, or occurs only with low probability, or an unintentional deviation of the feeler from an intended path on the surface does not occur, or occurs only with low probability.

Abstract: A work piece is measured by at least one point of a surface of the work piece being sampled by a feeler. The feeler exerts a probing force on the surface and the feeler is deflected relative to a mounting of the feeler. On the basis of the deflection, a position of the point of the surface is determined. A directional dependence of a flexibility of the feeler is determined and/or is known. The feeler and the work piece are positioned and/or oriented relative to each other, while taking into consideration the directional dependence, such that during sampling of the point of the surface unintentional slipping of the feeler on the surface does not occur, or occurs only with low probability, or an unintentional deviation of the feeler from an intended path on the surface does not occur, or occurs only with low probability.

Abstract: A method measures values on a workpiece (7) using a coordinate measuring apparatus which has a measuring probe head (5) with a deflectable probe pin (6). The coordinate measuring apparatus can carry out a linear or nonlinear projection (transformation) of the deflection signals (s) determined by the measuring probe head (5) into a coordinate system (XM, YM, ZM) of the coordinate measuring apparatus using parameters (A). In order to be able to use the method for any measuring probe, more particularly probes whose probe pins are not moveably guided in the directions of the coordinates, at least a portion of the parameters (Aanti) describes components of the deflection of the probe pin which are located tangentially relative to the surface of the workpiece on the touch point.

Abstract: A method measures values on a workpiece (7) using a coordinate measuring apparatus which has a measuring probe head (5) with a deflectable probe pin (6). The coordinate measuring apparatus can carry out a linear or nonlinear projection (transformation) of the deflection signals (s) determined by the measuring probe head (5) into a coordinate system (XM, YM, ZM) of the coordinate measuring apparatus using parameters (A). In order to be able to use the method for any measuring probe, more particularly probes whose probe pins are not moveably guided in the directions of the coordinates, at least a portion of the parameters (Aanti) describes components of the deflection of the probe pin which are located tangentially relative to the surface of the workpiece on the touch point.

Abstract: The invention relates to the determination of correction parameters of a rotating swivel unit. An optical sensor (9) measuring in at least one dimension is fixed to the unit. The sensor is calibrated on a calibration body in at least three rotational positions of a rotating joint of the rotating swivel unit. At least parameters of a first parameter field are calculated, the field describing the transformation (rotation) of a sensor coordinate system (u,v,w) in the machine coordinate system (XM, YM, ZM) , and parameters of another parameter field are determined, the other field describing the shift (vector) of the sensor coordinate system in relation to the point (AB) (in the measuring arm) in the machine coordinate system.

Abstract: The invention relates to the determination of correction parameters of a rotating swivel unit. An optical sensor (9) measuring in at least one dimension is fixed to the unit. The sensor is calibrated on a calibration body in at least three rotational positions of a rotating joint of the rotating swivel unit. At least parameters of a first parameter field are calculated, the field describing the transformation (rotation) of a sensor coordinate system (u, v, w) in the machine coordinate system (XM, YM, ZM) , and parameters of another parameter field are determined, the other field describing the shift (vector) of the sensor coordinate system in relation to the point (AB) (in the measuring arm) in the machine coordinate system.

Abstract: The invention is directed to a method for correcting the measuring results of a coordinate measuring apparatus wherein a workpiece is continuously scanned. The dynamic bending characteristic of the probe is determined or a multidimensional parameter field especially as a dynamic tensor (D). Corrective values are computed from the parameter field D while considering the acceleration of the probe ({right arrow over (b)}). Then, the measuring results are corrected with corrective values. To improve the accuracy of the method, the parameter field is the product of the static bending tensor (NT) of the probe and the mass tensor (MT+mE) of the probe and/or the parameter field describes the deviations normal to the workpiece surface by accelerating the probe.

Abstract: The invention is directed to an articulating device for a probe head (4) of a coordinate measuring apparatus with the articulating device having at least two rotation joints (14, 15) for angularly aligning the probe head (4). In this articulating device, corrective values are assigned to the device with which the errors caused by the elastic deformation of the articulating device are corrected when making measurements. To improve the measuring results, a mathematical model is used for correcting the deformation and this mathematical model includes at least one mathematical finite element (17, 18).

Abstract: The invention is directed to a method for correcting the measuring results of a coordinate measuring apparatus wherein a workpiece is continuously scanned. The dynamic bending characteristic of the probe is determined or a multidimensional parameter field especially as a dynamic tensor (D). Corrective values are computed from the parameter field D while considering the acceleration of the probe ({right arrow over (b)}). Then, the measuring results are corrected with corrective values. To improve the accuracy of the method, the parameter field is the product of the static bending tensor (NT) of the probe and the mass tensor (MT+mE) of the probe and/or the parameter field describes the deviations normal to the workpiece surface by accelerating the probe.

Abstract: The invention is directed to an articulating device for a probe head (4) of a coordinate measuring apparatus with the articulating device having at least two rotation joints (14, 15) for angularly aligning the probe head (4). In this articulating device, corrective values are assigned to the device with which the errors caused by the elastic deformation of the articulating device are corrected when making measurements. To improve the measuring results, a mathematical model is used for correcting the deformation and this mathematical model includes at least one mathematical finite element (17, 18).

Abstract: The invention is directed to a method for manually measuring a workpiece with a manually guided coordinate measuring apparatus. The apparatus includes a carrier for a probe which, in turn, carries a probe ball 12 on a deflectable probe pin 11. The carrier is movably journalled in several spatial directions. The probe ball 12 is brought into contact with the geometric element of the workpiece 30' to be measured and is guided therealong in continuous contact therewith. Signals (.phi., .psi., z) of coordinate measuring devices are generated with the movement of the probe. Signals (u, v, w) of a transducer of the probe are generated with a deflection of the probe pin 11. Control signals (80 to 84) are generated from the first signals and/or the second signals and these control signals characterize the start and the end of the measuring operation on the geometric element and the validity of the coordinate measurement values (X, Y, Z).

Abstract: The invention is directed to a method for calibrating a coordinate measuring apparatus which has a probe 10. The probe 10 is movably guided in a plane (x, y) via two parallel pivot axes (6, 8) which are arranged one behind the other. For calibrating the primary dimensions (R1, R2, .phi.0, .psi.0, dT) of the coordinate measuring apparatus, contours or geometric elements are contact scanned on a calibration body with the probe. The contours or geometric elements are so selected that the diameter dT of the probe ball 12 attached to the probe enters into the measuring result for the geometric elements or their spacing with different weight or sign. Thereafter, the primary dimensions (R1, R2, .phi.0, .psi.0, dT) are determined from the measured values obtained by contact scanning the contours for the position of the probe 10 in the plane (x, y) and from the known dimensions of the geometric elements.