Abstract: A disk brake for a railway vehicle is provided. The disk brake includes a brake disk, a brake caliper encompassing the brake disk, the brake caliper pressing a brake lining disposed on a brake lining retainer against the brake disk in case of actuation via a brake lever. The brake lever and the brake lining retainer are connected to each other by a hinged connection, wherein the brake lever and the brake lining retainer are electrically insulated from each other.

Abstract: A bracing element for bracing a piezoelectric multiple layer component includes a tubular body that is at least partially corrugated. A piezoelectric actuator with the bracing element is also disclosed.

Abstract: A spring element for pretensioning a piezoelectric actuator is specified, wherein the spring element has a tubular body with recesses. The recesses are each made in the form of a polygon with rounded corners. A piezoelectric actuator with such a spring element is also specified.

Abstract: A bracing element for bracing a piezoelectric multiple layer component includes a tubular body that is at least partially corrugated. A piezoelectric actuator with the bracing element is also disclosed.

Abstract: A spring element for pretensioning a piezoelectric actuator is specified, wherein the spring element has a tubular body with recesses. The recesses are each made in the form of a polygon with rounded corners. A piezoelectric actuator with such a spring element is also specified.

Abstract: This source for charged particles comprises a sharply pointed tip (1) and an aperture (2) in a thin sheet of material. If the point of the tip (1) is made sharp enough, i.e., if it ends in a single atom or a trimer of atoms, the electric field existing between the tip (1) and the aperture (2) will cause a stream of electrons to be emitted from the tip (1), pass the aperture (2) and to continue as a beam (4) of free electrons beyond said aperture (2). The sheet (3) carrying the aperture (2) may, for example, be a carbon foil or a metallic foil, including gold. The distance of the tip (1) from the aperture (2) is in the submicron range, and so is the diameter of said aperture (2). The distance is being held essentially constant by means of a feedback loop system. The divergence of the beam (4) is <2.degree..

Abstract: A method for fabricating exactly aligned apertures for use in electron and ion microscopy involves the placing of a very sharply pointed tip (1) in front of a set of extremely thin, precisely spaced metal foils (3,5) in an atmosphere of heavy gas atoms. The application of an elevated voltage at the tip (1) will result in a sputtering operation to commence and erode the metal foils (3,5) at a location underneath the facing tip (1). The sputtering operation is continued until the first ions are detected to emerge on the far side of the lens structure (2).