Abstract: An apparatus and a method for detecting defects within a photovoltaic module are provided. To detect defects within the photovoltaic module, light from a light source is directed towards the photovoltaic module. The light generates a voltage within each solar cell of the photovoltaic module. The generated voltages are measured and compared in order to detect defects within the solar cells of the photovoltaic module.

Abstract: An apparatus is provided for evaluating characteristics of a photovoltaic device with an exposed back contact layer having a plurality of electrically discrete areas arranged in a grid. The apparatus may include, for example, a light source for illuminating the photovoltaic device and a probe head assembly having a plurality of probes arranged in a grid corresponding to the grid on the photovoltaic device so that a given pair of the probes corresponds to a respective one of the electrically discrete areas within the grid. The probes and photovoltaic device may be positionable so that the probes contact the back contact layer. Related methods for evaluating characteristics are also provided.