Abstract: Measurement values of a detection channel are corrected, where measurement values are acquired from an arrangement of a plurality of individually readable optical individual detectors, and the measurement values of a selection of the optical individual detectors of the array are assigned to a detection channel. A plurality of optical individual detectors are combined in accordance with a basic pattern to form a respective detection channel and their measurement values are jointly assigned to the detection channel. If at least one defective individual detector is present, the combination in accordance with the basic pattern is cancelled. For the cancelled combination of individual detectors, a changed basic pattern is defined and measurement values of the individual detectors are acquired according to the changed basic pattern. The measurement values of the defective individual detector are corrected using measurement values of individual detectors around the defective detector in the changed basic pattern.

Abstract: Microscopy and a device for microscopy where with a light field arrangement comprising a multi-lens array and a camera having at least one camera sensor, image data sets which each contain at least one partial image of a sample are successively recorded. To increase a number of the image data sets recordable per unit time, a) measurement data only from a first number of pixels less than a total number of pixels of the at least one camera sensor are read out; b) measurement data only from a second number of pixels less than the total number of pixels or the first number of pixels read are processed further; and/or c) for some or all of the total number of pixels or the first number of pixels read, measurement data are processed further with a bit depth which is less than a maximum possible bit depth.

Abstract: Method and microscope for SPIM microscopy, wherein, in a first step, with reference to a sample to be examined, a calibration is carried out in that the actual position of the light sheet in different sample planes is detected and stored depending on the position in the sample and, in a second step, the stored position of the light sheet is utilized during observation and/or detection of the sample based on the values stored in the first step to correct the position of the light sheet relative to the focal plane of the detection objective and/or, during the displacement of the sample, an adjustment of the position of the light sheet relative to the focal plane of the detection objective is carried out such that the light sheet executes a relative movement in at least one direction relative to the sample and/or the detection objective.

Abstract: Method and microscope for SPIM microscopy, wherein, in a first step, with reference to a sample to be examined, a calibration is carried out in that the actual position of the light sheet in different sample planes is detected and stored depending on the position in the sample and, in a second step, the stored position of the light sheet is utilized during observation and/or detection of the sample based on the values stored in the first step to correct the position of the light sheet relative to the focal plane of the detection objective and/or, during the displacement of the sample, an adjustment of the position of the light sheet relative to the focal plane of the detection objective is carried out such that the light sheet executes a relative movement in at least one direction relative to the sample and/or the detection objective.