Patents by Inventor Wilfried Hammelehle

Wilfried Hammelehle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for monitoring sensor function
    Patent number: 8005629
    Abstract: A method for monitoring the functioning of sensors for the measurement and monitoring of state parameters of liquids or gases, especially in the field of process measurement technology, for example of electrochemical, electrophysical or optical sensors, wherein the sensor is placed into a test state at time intervals and test parameters are registered, or these test parameters are registered at time intervals in the course of the measured value registration. The registered parameters are stored and a backwards-looking, chronological development of the stored test parameters is evaluated for performing the functional monitoring and the development of sensor behavior to be expected in the future is predicted therefrom and information concerning the duration of the remaining, disturbance-free operation of the sensor is obtained.
    Type: Grant
    Filed: August 26, 2003
    Date of Patent: August 23, 2011
    Assignee: Endress+Hauser Conducta Gesellschaft Für Mess-u. Regeltechnik mbH+Co. KG
    Inventors: Dirk Steinmueller, Wilfried Hammelehle, Detlev Wittmer, Axel Fikus
  • Method for monitoring sensor function
    Publication number: 20060155511
    Abstract: The invention relates to a method for monitoring the functioning of sensors for the measurement and monitoring of state parameters of liquids or gases, especially in the field of process measurement technology, for example of electrochemical, electrophysical or optical sensors, wherein the sensor is placed into a test state at time intervals and test parameters are registered, or these test parameters are registered at time intervals in the course of the measured value registration, wherein the registered parameters are stored and a backwards-looking, chronological development of the stored test parameters is evaluated for performing the functional monitoring and the development of sensor behavior to be expected in the future is predicted therefrom and information concerning the duration of the remaining, disturbance-free operation of the sensor is obtained.
    Type: Application
    Filed: August 26, 2003
    Publication date: July 13, 2006
    Applicant: ENDREAS + HAUSER CONDUCTA GMBH + CO. KG
    Inventors: Dirk Steinmueller, Wilfried Hammelehle, Detlev Wittmer, Axel Fikus