Abstract: A device for measuring a particle beam, includes front and rear faces, a first central portion including a device for forming a space charge region through which a particle beam to be measured passes, charge carriers of a first and second type being generated by the beam when the latter passes through the space charge region, a second peripheral portion including a device for collecting at least one type of charge carrier from the first or second type of charge carriers generated in the space charge region, the central portion having a maximum thickness less than or equal to that of the peripheral portion, the peripheral portion surrounding the central portion such that a particle beam can pass through the central portion without passing through the peripheral portion. The device includes, in a region of the central portion leading to the rear face, a layer of a porous material.

Abstract: A one-piece device for detecting particles with semiconductor material includes a substrate layer and at least one additional layer disposed on a first face of the substrate layer so as to form at least one first detector comprising a first space charge zone through which a beam of particles passes and first collector means for charge carriers produced by this passage. It further includes at least one other additional layer disposed on a second face of the same substrate layer, opposite the first face, so as to form at least one second detector comprising a second space charge zone through which the beam of particles also passes and second collector means for charge carriers produced by this passage.