Abstract: A method for presenting various surfaces of particles within a sample to a sensor device is provided. More particularly, embodiments of the present invention provide a method for presenting a sample comprising a plurality of sample particles to a scanning field defined by a sensor device, the method including directing the sample into a scanning chamber configured to contain at least a portion of the scanning field of the sensor device, subjecting the sample to different relative velocities, and redirecting the sample into the scanning chamber such that the plurality of sample particles of the sample are reoriented relative to the scanning field defined by the sensor device. In some embodiments, at least one trait of the sample is measured with the sensor device.

Abstract: A system and method for measuring a quality parameter of a harvested crop are provided. Specifically, the system is adapted to be carried by a harvesting device such that a sensor is enclosed in a controlled environment and such that the sensor is capable of precisely and reliably measuring the quality parameter while the harvesting device is in operation. The system includes a verification device and an actuator device contained within the controlled environment. The actuator device periodically conveys the sensor device to at least one of a verification position relative to the verification device and a measurement position. Thus, the sensor device may be periodically and reliably referenced and/or validated while in use in harsh agricultural environments such that the sensor device is capable of accurately measuring the quality parameter as the crop is harvested.

Abstract: A method for presenting various surfaces of particles within a sample to a sensor device is provided. More particularly, embodiments of the present invention provide a method for presenting a sample comprising a plurality of sample particles to a scanning field defined by a sensor device, the method including directing the sample into a scanning chamber configured to contain at least a portion of the scanning field of the sensor device, subjecting the sample to different relative velocities, and redirecting the sample into the scanning chamber such that the plurality of sample particles of the sample are reoriented relative to the scanning field defined by the sensor device. In some embodiments, at least one trait of the sample is measured with the sensor device.

Abstract: An apparatus and method for presenting various surfaces of particles within a sample to a sensor device is provided. More particularly, embodiments of the present invention provide a pair of concentric counter-rotating surfaces and a dividing member fixed radially therebetween so as to form a scanning chamber wherein sample particles are reoriented relative to the scanning field of an adjacent sensor device by the counter-rotation of the surfaces and the consequent recirculation of the sample particles through the scanning chamber.

Abstract: An apparatus and method for presenting various surfaces of particles within a sample to a sensor device is provided. More particularly, embodiments of the present invention provide a pair of concentric counter-rotating surfaces and a dividing member fixed radially therebetween so as to form a scanning chamber wherein sample particles are reoriented relative to the scanning field of an adjacent sensor device by the counter-rotation of the surfaces and the consequent recirculation of the sample particles through the scanning chamber.

Abstract: A system and method for measuring a quality parameter of a harvested crop are provided. Specifically, the system is adapted to be carried by a harvesting device such that a sensor is enclosed in a controlled environment and such that the sensor is capable of precisely and reliably measuring the quality parameter while the harvesting device is in operation. The system includes a verification device and an actuator device contained within the controlled environment. The actuator device periodically conveys the sensor device to at least one of a verification position relative to the verification device and a measurement position. Thus, the sensor device may be periodically and reliably referenced and/or validated while in use in harsh agricultural environments such that the sensor device is capable of accurately measuring the quality parameter as the crop is harvested.