Patents by Inventor Wilhelm Schebesta
Wilhelm Schebesta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 8836938Abstract: The description relates to a standard for wavelength and intensity for spectrometers, particularly for calibrating and testing measurement heads in spectrometers which are usable primarily in the near infrared region (NIR) of the spectrum. The standard comprises a holder and a plate body arranged in the holder. The plate body is made of transparent plastic with high strength and dimensional stability over a large temperature range. The plastic has distinct absorption bands throughout the entire NIR range and has a chemical structure and composition ensuring an extensive moisture barrier against water absorption and water release in a reliable and stable manner over time. The plate body advantageously comprises an amorphous, transparent copolymer based on cyclic and/or linear olefins.Type: GrantFiled: May 19, 2008Date of Patent: September 16, 2014Assignee: Carl Zeiss Microscopy GmbHInventors: Wilhelm Schebesta, Nico Correns, Lutz Freytag, Michael Rode
-
Publication number: 20110007319Abstract: The invention relates to an arrangement for measuring the reflectivity of the direct or scattered reflection of a sample (8), having a light source for separately lighting the sample (8) and of comparative surfaces. The arrangement comprises, in addition to the light source, preferably a reflector lamp (2), —a white standard (6), a black standard (7), and the surface of the sample (8) for embodying a measurement surface, wherein the exchange of the white standard (6), the black standard (7) and the sample (8) is provided in a prescribed sequence relative to each other, —means for measuring the intensity of the light reflected from an internal white surface (10) and for measuring the intensity of the light reflected from each measuring surface, and—an evaluation circuit designed for registering the measured intensity values and for linking the same mathematically to the reflectivity.Type: ApplicationFiled: December 10, 2008Publication date: January 13, 2011Applicant: CARL ZEISS MICROIMAGING GMBHInventors: Nico Correns, Werner Hoyme, Felix Kerstan, Thomas Keune, Wilhelm Schebesta
-
Patent number: 7671984Abstract: An arrangement for measuring the diffuse reflection of samples and a method for internal recalibration of the measuring head. The spectrometric measuring head with a device for recalibration comprises a housing which is provided with a window and which contains an illumination source, a spectrometer arrangement and at least two standards for internal recalibration. The two standards can be swiveled into the beam path of the measuring head selectively so that the measurement light emitted by the illumination source can be used in its entirety for recalibration. A processor for acquiring and processing measured values and an interface to a bus system are arranged in the housing. Accordingly, relatively time-consuming calibration of the measuring head at the place of use is required only before putting into operation or at longer time intervals. By the internal recalibrations, it is possible to prevent changes in the measured values in long-term operation.Type: GrantFiled: April 26, 2005Date of Patent: March 2, 2010Assignee: Carl Zeiss MicroImaging GmbHInventors: Wilhelm Schebesta, Werner Hoyme, Michael Rode, Nico Correns, Martin Goetz
-
Publication number: 20090002696Abstract: The description relates to a standard for wavelength and intensity for spectrometers, particularly for calibrating and testing measurement heads in spectrometers which are usable primarily in the near infrared region (NIR) of the spectrum. The standard comprises a holder and a plate body arranged in the holder. The plate body is made of transparent plastic with high strength and dimensional stability over a large temperature range. The plastic has distinct absorption bands throughout the entire NIR range and has a chemical structure and composition ensuring an extensive moisture barrier against water absorption and water release in a reliable and stable manner over time. The plate body advantageously comprises an amorphous, transparent copolymer based on cyclic and/or linear olefins.Type: ApplicationFiled: May 19, 2008Publication date: January 1, 2009Inventors: WILHELM SCHEBESTA, Nico Correns, Lutz Freytag, Michael Rode
-
Publication number: 20070236692Abstract: The present invention is directed to an arrangement for measuring the diffuse reflection of samples and to a method for the internal recalibration of the measuring head. According to the invention, the spectrometric measuring head with means for recalibration comprises a housing which is provided with a window and which contains an illumination source, a spectrometer arrangement and at least two standards for internal recalibration. The two standards can be swiveled into the beam path of the measuring head selectively in such a way that the measurement light emitted by the illumination source can be used in its entirety for recalibration. Further, a processor for acquiring and processing the measured values and an interface to a bus system are arranged in the housing. With the solution according to the invention, the relatively time-consuming calibration of the measuring head at the place of use is required only before putting into operation or at longer time intervals.Type: ApplicationFiled: June 1, 2006Publication date: October 11, 2007Inventors: Wilhelm Schebesta, Werner Hoyme, Michael Rode, Nico Correns, Martin Goetz
-
Publication number: 20030202180Abstract: An optical measuring arrangement, particularly for quality control in continuous material flow processes, comprising a measuring head which is arranged immediately adjacent to a measurement object, a measurement light source which is held at the measuring head for illuminating a measurement spot on the measurement object, a measurement light reception device, at least one spectrometer which is optically coupled with the measurement light reception device via a light-conducting device, wherein the spectrometer and the light-conducting device are received in the measuring head, and a signal processing device which is likewise received in the measuring head. This results in a compact arrangement for reflection measurement which is easy to assemble and which, beyond this, supplies very accurate measurement results. Further, a measuring arrangement operating on the principle of spectroscopy is suggested for transmission measurement.Type: ApplicationFiled: April 24, 2003Publication date: October 30, 2003Inventors: Juergen Gobel, Werner Hoyme, Martin Goetz, Wilhelm Schebesta
-
Patent number: 6606156Abstract: A spectrometer is provided having a carrier, a light input for measurement light disposed on the carrier, a diffraction grating disposed on the carrier for dispersing the measurement light received from the light input, an opto-electronic detector disposed on the carrier for receiving and detecting the measurement light dispersed by the diffraction grating, at least one optical component for imaging the measurement light on the detector through the diffraction grating, a base board fastened to said carrier for supporting the opto-electronic detector, wherein the opto-electronic detector is fastened at a predetermined position on the base board, and wherein the base board and the carrier include positioning members for relatively positioning the base board on the carrier in a predetermined position. Preferably, the detector is a detector chip excluding a housing and fastened in a predetermined position on the base board.Type: GrantFiled: March 30, 2000Date of Patent: August 12, 2003Assignee: Gretag-Macbeth AGInventors: Peter Ehbets, Adrian von Orelli, Eckard Vasold, Wilhelm Schebesta
-
Publication number: 20020001078Abstract: An optical measuring arrangement, particularly for quality control in continuous material flow processes, comprising a measuring head which is arranged immediately adjacent to a measurement object, a measurement light source which is held at the measuring head for illuminating a measurement spot on the measurement object, a measurement light reception device, at least one spectrometer which is optically coupled with the measurement light reception device via a light-conducting device, wherein the spectrometer and the light-conducting device are received in the measuring head, and a signal processing device which is likewise received in the measuring head. This results in a compact arrangement for reflection measurement which is easy to assemble and which, beyond this, supplies very accurate measurement results. Further, a measuring arrangement operating on the principle of spectroscopy is suggested for transmission measurement.Type: ApplicationFiled: March 1, 2001Publication date: January 3, 2002Inventors: Juergen Gobel, Werner Hoyme, Martin Goetz, Wilhelm Schebesta
-
Patent number: 5764352Abstract: Optical measuring apparatus for determining chromaticity of thin films on a substrate includes a light source for illuminating the substrate and a measuring apparatus for dispersing light into various wavelengths and making wavelength dependent intensity measurements. Radiation from the light source is reflected or transmitted by the substrate to the measuring apparatus along a first beam path having a first diaphragm for cutting off the radiation from the substrate in a leak-tight manner. Radiation from the light source is also transmitted to the measuring apparatus directly along a second beam path having a second diaphragm for cutting off radiation from the light source in a leak-tight manner. The light source (6a) consists of a globe photometer (6a), in which a lamp (4) is provided. A steadily burning light source, especially a halogen lamp, is used as the lamp (4).Type: GrantFiled: August 1, 1996Date of Patent: June 9, 1998Assignee: Balzers UND Leybold Deutschland Holding AGInventors: Peter Kappel, Werner Lenz, Walter Muller, Christian Schaffer, Wilhelm Schebesta, Ulrich Basler, Jens Mondry, Jurgen Gobel