Patents by Inventor Wilhelm Schebesta

Wilhelm Schebesta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8836938
    Abstract: The description relates to a standard for wavelength and intensity for spectrometers, particularly for calibrating and testing measurement heads in spectrometers which are usable primarily in the near infrared region (NIR) of the spectrum. The standard comprises a holder and a plate body arranged in the holder. The plate body is made of transparent plastic with high strength and dimensional stability over a large temperature range. The plastic has distinct absorption bands throughout the entire NIR range and has a chemical structure and composition ensuring an extensive moisture barrier against water absorption and water release in a reliable and stable manner over time. The plate body advantageously comprises an amorphous, transparent copolymer based on cyclic and/or linear olefins.
    Type: Grant
    Filed: May 19, 2008
    Date of Patent: September 16, 2014
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Wilhelm Schebesta, Nico Correns, Lutz Freytag, Michael Rode
  • Publication number: 20110007319
    Abstract: The invention relates to an arrangement for measuring the reflectivity of the direct or scattered reflection of a sample (8), having a light source for separately lighting the sample (8) and of comparative surfaces. The arrangement comprises, in addition to the light source, preferably a reflector lamp (2), —a white standard (6), a black standard (7), and the surface of the sample (8) for embodying a measurement surface, wherein the exchange of the white standard (6), the black standard (7) and the sample (8) is provided in a prescribed sequence relative to each other, —means for measuring the intensity of the light reflected from an internal white surface (10) and for measuring the intensity of the light reflected from each measuring surface, and—an evaluation circuit designed for registering the measured intensity values and for linking the same mathematically to the reflectivity.
    Type: Application
    Filed: December 10, 2008
    Publication date: January 13, 2011
    Applicant: CARL ZEISS MICROIMAGING GMBH
    Inventors: Nico Correns, Werner Hoyme, Felix Kerstan, Thomas Keune, Wilhelm Schebesta
  • Patent number: 7671984
    Abstract: An arrangement for measuring the diffuse reflection of samples and a method for internal recalibration of the measuring head. The spectrometric measuring head with a device for recalibration comprises a housing which is provided with a window and which contains an illumination source, a spectrometer arrangement and at least two standards for internal recalibration. The two standards can be swiveled into the beam path of the measuring head selectively so that the measurement light emitted by the illumination source can be used in its entirety for recalibration. A processor for acquiring and processing measured values and an interface to a bus system are arranged in the housing. Accordingly, relatively time-consuming calibration of the measuring head at the place of use is required only before putting into operation or at longer time intervals. By the internal recalibrations, it is possible to prevent changes in the measured values in long-term operation.
    Type: Grant
    Filed: April 26, 2005
    Date of Patent: March 2, 2010
    Assignee: Carl Zeiss MicroImaging GmbH
    Inventors: Wilhelm Schebesta, Werner Hoyme, Michael Rode, Nico Correns, Martin Goetz
  • Publication number: 20090002696
    Abstract: The description relates to a standard for wavelength and intensity for spectrometers, particularly for calibrating and testing measurement heads in spectrometers which are usable primarily in the near infrared region (NIR) of the spectrum. The standard comprises a holder and a plate body arranged in the holder. The plate body is made of transparent plastic with high strength and dimensional stability over a large temperature range. The plastic has distinct absorption bands throughout the entire NIR range and has a chemical structure and composition ensuring an extensive moisture barrier against water absorption and water release in a reliable and stable manner over time. The plate body advantageously comprises an amorphous, transparent copolymer based on cyclic and/or linear olefins.
    Type: Application
    Filed: May 19, 2008
    Publication date: January 1, 2009
    Inventors: WILHELM SCHEBESTA, Nico Correns, Lutz Freytag, Michael Rode
  • Publication number: 20070236692
    Abstract: The present invention is directed to an arrangement for measuring the diffuse reflection of samples and to a method for the internal recalibration of the measuring head. According to the invention, the spectrometric measuring head with means for recalibration comprises a housing which is provided with a window and which contains an illumination source, a spectrometer arrangement and at least two standards for internal recalibration. The two standards can be swiveled into the beam path of the measuring head selectively in such a way that the measurement light emitted by the illumination source can be used in its entirety for recalibration. Further, a processor for acquiring and processing the measured values and an interface to a bus system are arranged in the housing. With the solution according to the invention, the relatively time-consuming calibration of the measuring head at the place of use is required only before putting into operation or at longer time intervals.
    Type: Application
    Filed: June 1, 2006
    Publication date: October 11, 2007
    Inventors: Wilhelm Schebesta, Werner Hoyme, Michael Rode, Nico Correns, Martin Goetz
  • Publication number: 20030202180
    Abstract: An optical measuring arrangement, particularly for quality control in continuous material flow processes, comprising a measuring head which is arranged immediately adjacent to a measurement object, a measurement light source which is held at the measuring head for illuminating a measurement spot on the measurement object, a measurement light reception device, at least one spectrometer which is optically coupled with the measurement light reception device via a light-conducting device, wherein the spectrometer and the light-conducting device are received in the measuring head, and a signal processing device which is likewise received in the measuring head. This results in a compact arrangement for reflection measurement which is easy to assemble and which, beyond this, supplies very accurate measurement results. Further, a measuring arrangement operating on the principle of spectroscopy is suggested for transmission measurement.
    Type: Application
    Filed: April 24, 2003
    Publication date: October 30, 2003
    Inventors: Juergen Gobel, Werner Hoyme, Martin Goetz, Wilhelm Schebesta
  • Patent number: 6606156
    Abstract: A spectrometer is provided having a carrier, a light input for measurement light disposed on the carrier, a diffraction grating disposed on the carrier for dispersing the measurement light received from the light input, an opto-electronic detector disposed on the carrier for receiving and detecting the measurement light dispersed by the diffraction grating, at least one optical component for imaging the measurement light on the detector through the diffraction grating, a base board fastened to said carrier for supporting the opto-electronic detector, wherein the opto-electronic detector is fastened at a predetermined position on the base board, and wherein the base board and the carrier include positioning members for relatively positioning the base board on the carrier in a predetermined position. Preferably, the detector is a detector chip excluding a housing and fastened in a predetermined position on the base board.
    Type: Grant
    Filed: March 30, 2000
    Date of Patent: August 12, 2003
    Assignee: Gretag-Macbeth AG
    Inventors: Peter Ehbets, Adrian von Orelli, Eckard Vasold, Wilhelm Schebesta
  • Publication number: 20020001078
    Abstract: An optical measuring arrangement, particularly for quality control in continuous material flow processes, comprising a measuring head which is arranged immediately adjacent to a measurement object, a measurement light source which is held at the measuring head for illuminating a measurement spot on the measurement object, a measurement light reception device, at least one spectrometer which is optically coupled with the measurement light reception device via a light-conducting device, wherein the spectrometer and the light-conducting device are received in the measuring head, and a signal processing device which is likewise received in the measuring head. This results in a compact arrangement for reflection measurement which is easy to assemble and which, beyond this, supplies very accurate measurement results. Further, a measuring arrangement operating on the principle of spectroscopy is suggested for transmission measurement.
    Type: Application
    Filed: March 1, 2001
    Publication date: January 3, 2002
    Inventors: Juergen Gobel, Werner Hoyme, Martin Goetz, Wilhelm Schebesta
  • Patent number: 5764352
    Abstract: Optical measuring apparatus for determining chromaticity of thin films on a substrate includes a light source for illuminating the substrate and a measuring apparatus for dispersing light into various wavelengths and making wavelength dependent intensity measurements. Radiation from the light source is reflected or transmitted by the substrate to the measuring apparatus along a first beam path having a first diaphragm for cutting off the radiation from the substrate in a leak-tight manner. Radiation from the light source is also transmitted to the measuring apparatus directly along a second beam path having a second diaphragm for cutting off radiation from the light source in a leak-tight manner. The light source (6a) consists of a globe photometer (6a), in which a lamp (4) is provided. A steadily burning light source, especially a halogen lamp, is used as the lamp (4).
    Type: Grant
    Filed: August 1, 1996
    Date of Patent: June 9, 1998
    Assignee: Balzers UND Leybold Deutschland Holding AG
    Inventors: Peter Kappel, Werner Lenz, Walter Muller, Christian Schaffer, Wilhelm Schebesta, Ulrich Basler, Jens Mondry, Jurgen Gobel