Patents by Inventor Wilhelmus J. J. Welters

Wilhelmus J. J. Welters has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6181774
    Abstract: An X-ray examination apparatus of this invention comprises an X-ray source, an X-ray detector and an X-ray filter which is located between the X-ray source and the X-ray detector. The X-ray filter includes filter elements, notably capillary tubes, and the X-ray absorption of separate filter elements can be controlled by controlling a quantity of X-ray absorbing liquid in the respective filter elements. The quantity of X-ray absorbing liquid in the individual filter elements is controlled by way of electric voltages applied to the individual filter elements. The filter elements are formed as spaces between deformed foils which are arranged in a stack which is expanded in the direction transversely of the foils. Adjacent foils are locally attached to one another along seams. The stack is arranged between rigid plates and buffer elements are provided between the rigid plates and the stack. The buffer elements are contractable in the direction transversely to the direction of expansion of the stack.
    Type: Grant
    Filed: May 21, 1999
    Date of Patent: January 30, 2001
    Assignee: U.S. Philips Corporation
    Inventors: Menno W. J. Prins, Jacobus B. Giesbers, Johannes W. Weekamp, Theodorus J. A. M. Jans, Wilhelmus J. J. Welters, Nicolaas P. Willard
  • Patent number: 6118855
    Abstract: X-ray examination apparatus including a filter An X-ray examination apparatus (1) includes an X-ray source (2), an X-ray detector (5) and an X-ray filter (6). The X-ray filter (6) is arranged between the X-ray source and the X-ray detector. The X-ray filter (6) includes a plurality of filter elements (7) whose X-ray absorptivity can be adjusted by adjusting a quantity of X-ray absorbing liquid (30) present in individual filter elements (7). The filter elements are formed by substantially parallel plates (8), respective plates being provided with separating members (10) which project approximately transversely from the plane of such a plate. The filter elements are formed notably by parallel corrugated plates or by parallel plates provided with partitions extending transversely from the plates.
    Type: Grant
    Filed: May 21, 1998
    Date of Patent: September 12, 2000
    Assignee: U.S. Philips Corporation
    Inventors: Wilhelmus J. J. Welters, Edward W. A. Young
  • Patent number: 6061426
    Abstract: An X-ray examination apparatus includes an X-ray source (1) for emitting X-rays. An object to be radiologically examined is arranged in an examination space. An X-ray detector (2) derives an image signal, for example an electronic video signal, from an X-ray image of the object. An X-ray filter locally attenuates the X-rays partly. The X-ray filter is arranged between the X-ray source and the X-ray detector and the X-ray filter is provided with filter elements whose X-ray absorptivity can be adjusted on the basis of an amount of X-ray absorbing liquid present within the individual filter elements.The X-ray examination apparatus includes an X-ray collimator for locally intercepting the X-rays. The X-ray collimator is arranged between the X-ray source and the examination space and is provided with collimator elements which can be switched between an X-ray transmitting state and an X-ray intercepting state.
    Type: Grant
    Filed: October 5, 1998
    Date of Patent: May 9, 2000
    Assignee: U.S. Philips Corporation
    Inventors: Petrus W. J. Linders, Herman Stegehuis, Wilhelmus J. J. Welters, Nicolaas P. Willard, Lambertus G. J. Fokkink
  • Patent number: 5966426
    Abstract: An X-ray examination apparatus (1) is provided with an X-ray source (2) and an X-ray detector (5) wherebetween there is arranged an X-ray filter (6) which includes filter elements (7) whose X-ray absorptivity can be adjusted by controlling the quantity of X-ray absorbing liquid (31) in individual filter elements (7). The filter elements (7) are formed by spaces between electrically conductive tracks (9) provided on parallel plates (8). The parallel plates are arranged in a reservoir (31) for the X-ray absorbing liquid. The liquid level in the vicinity of an electrically conductive track is controlled on the basis of an electric voltage applied to the relevant electrically conductive track (9).
    Type: Grant
    Filed: November 5, 1997
    Date of Patent: October 12, 1999
    Assignee: U.S. Philips Corporation
    Inventors: Johannes Marra, Wilhelmus J. J. Welters
  • Patent number: 5751786
    Abstract: An X-ray examination apparatus (1) includes a filter (4) which is arranged between the X-ray source (2) and the X-ray detector (3). The X-ray filter includes a large number of filter elements (5); the X-ray absorptivity of the filter elements can be adjusted by controlling the quantity of X-ray absorbing liquid (6) than individual filter elements. The filter elements are formed by metal capillary tubes or the wall of the capillary tubes, or the wall of the capillary tubes is provided with a metal layer (7). On the metal layer there is provided a dielectric layer (8) and the dielectric layer is covered by a coating layer (9). The dielectric layer is, for example a glass, parylene or polystyrene layer. The coating layer is, for example a Teflon, silane or siloxane layer. The dielectric layer can be dispensed with when a Teflon coating layer is used.
    Type: Grant
    Filed: July 12, 1996
    Date of Patent: May 12, 1998
    Assignee: U.S. Philips Corporation
    Inventors: Wilhelmus J. J. Welters, Jacob Wijdenes