Patents by Inventor Wilhelmus Sebastianus Marcus Maria Ketelaars

Wilhelmus Sebastianus Marcus Maria Ketelaars has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10538859
    Abstract: A method is disclosed involving depositing a neutral orientation template layer onto a substrate after formation of chemical epitaxy or graphoepitaxy features on the substrate, but before deposition and orientation of a self-assemblable polymer. The orientation layer is arranged to bond with the substrate but not with certain features, so that it may be easily removed by vacuum or rinsing with organic solvent. The neutral orientation layer has a chemical affinity to match that of blocks in the self-assemblable polymer so that blocks of differing types wet the neutral orientation layer so that domains in the self-assembled polymer may lie side by side along the substrate surface, with interfaces normal to the substrate surface. The resulting aligned and oriented self-assembled polymer may itself be used as a resist for device lithography of the substrate.
    Type: Grant
    Filed: December 9, 2011
    Date of Patent: January 21, 2020
    Assignee: ASML Netherlands B.V.
    Inventors: Emiel Peeters, Wilhelmus Sebastianus Marcus Maria Ketelaars, Johan Frederik Dijksman, Sander Frederik Wuister, Roelof Koole, Christianus Martinus Van Heesch
  • Patent number: 10240250
    Abstract: A graphoepitaxy template to align a self-assembled block polymer adapted to self-assemble into a 2-D array having parallel rows of discontinuous first domains extending parallel to a first axis, mutually spaced along an orthogonal second axis, and separated by a continuous second domain. The graphoepitaxy template has first and second substantially parallel side walls extending parallel to and defining the first axis and mutually spaced along the second axis to provide a compartment to hold at least one row of discontinuous first domains of the self-assembled block copolymer on the substrate between and parallel to the side walls, and separated therefrom by a continuous second domain. The compartment has a graphoepitaxial nucleation feature arranged to locate at least one of the discontinuous first domains at a specific position within the compartment. Methods for forming the graphoepitaxy template and its use for device lithography are also disclosed.
    Type: Grant
    Filed: October 2, 2012
    Date of Patent: March 26, 2019
    Assignee: ASML Netherlands B.V.
    Inventors: Thanh Trung Nguyen, Jozef Maria Finders, Wilhelmus Sebastianus Marcus Maria Ketelaars, Sander Frederik Wuister, Eddy Cornelis Antonius Van der Heijden, Hieronymus Johannus Christiaan Meessen, Roelof Koole, Emiel Peeters, Christianus Martinus Van Heesch, Aurelie Marie Andree Brizard, Henri Marie Joseph Boots, Tamara Druzhinina, Jessica Margaretha De Ruiter
  • Patent number: 9285676
    Abstract: A BCP having first block of first monomer and second block of second monomer, adapted to undergo a transition from disordered state to ordered state at a temperature less than TOD, further including a bridging moiety having a functional group to provide hydrogen bonding between bridging moieties of adjacent first and second BCP molecules when in the ordered state and at a temperature in excess of a glass transition temperature Tg for the BCP. Composition including BCP comprising first block of first monomer and second block of second monomer, and a crosslinking compound having first and second terminal groups joined by a central moiety and arranged to crosslink second blocks of adjacent first and second BCP molecules by providing non-covalent bonding between the terminal groups and a functional group of the second monomer of the second blocks when the BCP is in the ordered state.
    Type: Grant
    Filed: June 7, 2012
    Date of Patent: March 15, 2016
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Aurelie Marie Andree Brizard, Wilhelmus Sebastianus Marcus Maria Ketelaars, Sander Frederik Wuister, Roelof Koole, Emiel Peeters, Christianus Martinus Van Heesch, Henri Marie Joseph Boots, Thanh Trung Nguyen
  • Patent number: 9235125
    Abstract: A method of forming a patterned chemical epitaxy template, for orientation of a self-assemblable block copolymer including first and second polymer blocks, on a surface of a substrate, the method including applying a primer layer of a primer composition to the surface, the primer composition including a first polymer moiety having a chemical affinity with the first polymer blocks and a second polymer moiety having a chemical affinity with the second polymer blocks, selectively exposing the surface, the primer layer and any overlying layer to actinic radiation to provide exposed and unexposed regions, to render labile the first polymer moiety in the exposed region, and removing the labile first polymer moiety from the exposed region to deplete the primer layer surface in the exposed region of first polymer moiety to form the patterned chemical epitaxy template.
    Type: Grant
    Filed: February 6, 2013
    Date of Patent: January 12, 2016
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Emiel Peeters, Wilhelmus Sebastianus Marcus Maria Ketelaars, Sander Frederik Wuister, Roelof Koole, Christianus Martinus Van Heesch, Aurelie Marie Andree Brizard, Henri Marie Joseph Boots, Thanh Trung Nguyen, Oktay Yildirim
  • Publication number: 20150010869
    Abstract: A method of forming a patterned chemical epitaxy template, for orientation of a self-assemblable block copolymer including first and second polymer blocks, on a surface of a substrate, the method including applying a primer layer of a primer composition to the surface, the primer composition including a first polymer moiety having a chemical affinity with the first polymer blocks and a second polymer moiety having a chemical affinity with the second polymer blocks, selectively exposing the surface, the primer layer and any overlying layer to actinic radiation to provide exposed and unexposed regions, to render labile the first polymer moiety in the exposed region, and removing the labile first polymer moiety from the exposed region to deplete the primer layer surface in the exposed region of first polymer moiety to form the patterned chemical epitaxy template.
    Type: Application
    Filed: February 6, 2013
    Publication date: January 8, 2015
    Applicant: ASML Netherlands B.V.
    Inventors: Emiel Peeters, Wilhelmus Sebastianus Marcus Maria Ketelaars, Sander Frederik Wuister, Roelof Koole, Christianus Martinus Van Heesch, Aurelie Marie Andree Brizard, Henri Marie Joseph Boots, Thanh Trung Nguyen, Oktay Yildirim
  • Publication number: 20140299575
    Abstract: A BCP having first block of first monomer and second block of second monomer, adapted to undergo a transition from disordered state to ordered state at a temperature less than TOD, further including a bridging moiety having a functional group to provide hydrogen bonding between bridging moieties of adjacent first and second BCP molecules when in the ordered state and at a temperature in excess of a glass transition temperature Tg for the BCP. Composition including BCP comprising first block of first monomer and second block of second monomer, and a crosslinking compound having first and second terminal groups joined by a central moiety and arranged to crosslink second blocks of adjacent first and second BCP molecules by providing non-covalent bonding between the terminal groups and a functional group of the second monomer of the second blocks when the BCP is in the ordered state.
    Type: Application
    Filed: June 7, 2012
    Publication date: October 9, 2014
    Applicant: ASML Netherlands B.V.
    Inventors: Aurelie Marie Andree Brizard, Wilhelmus Sebastianus Marcus Maria Ketelaars, Sander Frederik Wuister, Roelof Koole, Emiel Peeters, Christianus Martinus Van Heesch, Henri Marie Joseph Boots, Thanh Trung Nguyen
  • Patent number: 8830446
    Abstract: An extreme ultraviolet exposure apparatus includes a radiation system configured to supply a beam of extreme ultraviolet radiation; a support configured to support a patterning device, the patterning device configured to pattern the beam of extreme ultraviolet radiation according to a desired pattern; a substrate table having an area configured to support a substrate; a projection system configured to project the patterned beam of extreme ultraviolet radiation onto a target portion of the substrate, the projection system comprising a reflective optical system; wherein at least a part of the apparatus that during use of the apparatus is exposed to the beam of extreme ultraviolet radiation is coated with a coating, the coating comprising a metal oxide, or a photocatalyst, or a semiconductor, or any combination thereof.
    Type: Grant
    Filed: June 26, 2013
    Date of Patent: September 9, 2014
    Assignee: ASML Netherlands B.V.
    Inventors: Arjen Boogaard, Timotheus Franciscus Sengers, Wilhelmus Sebastianus Marcus Maria Ketelaars, Carolus Ida Maria Antonius Spee
  • Publication number: 20140245948
    Abstract: A graphoepitaxy template to align a self-assembled block polymer adapted to self-assemble into a 2-D array having parallel rows of discontinuous first domains extending parallel to a first axis, mutually spaced along an orthogonal second axis, and separated by a continuous second domain. The graphoepitaxy template has first and second substantially parallel side walls extending parallel to and defining the first axis and mutually spaced along the second axis to provide a compartment to hold at least one row of discontinuous first domains of the self-assembled block copolymer on the substrate between and parallel to the side walls, and separated therefrom by a continuous second domain. The compartment has a graphoepitaxial nucleation feature arranged to locate at least one of the discontinuous first domains at a specific position within the compartment. Methods for forming the graphoepitaxy template and its use for device lithography are also disclosed.
    Type: Application
    Filed: October 2, 2012
    Publication date: September 4, 2014
    Applicant: ASML Netherlands B.V.
    Inventors: Thanh Trung Nguyen, Jozef Maria Finders, Wilhelmus Sebastianus Marcus Maria Ketelaars, Sander Frederik Wuister, Eddy Cornelis Antonius Van Der Heijden, Hieronymus Johannus Christiaan Meessen, Roelof Koole, Emiel Peeters, Christianus Martinus Van Heesch, Aurelie Marie Andree Brizard, Henri Marie Joseph Boots, Tamara Druzhinina, Jessica Marggaretha De Ruiter
  • Publication number: 20130286374
    Abstract: An extreme ultraviolet exposure apparatus includes a radiation system configured to supply a beam of extreme ultraviolet radiation; a support configured to support a patterning device, the patterning device configured to pattern the beam of extreme ultraviolet radiation according to a desired pattern; a substrate table having an area configured to support a substrate; a projection system configured to project the patterned beam of extreme ultraviolet radiation onto a target portion of the substrate, the projection system comprising a reflective optical system; wherein at least a part of the apparatus that during use of the apparatus is exposed to the beam of extreme ultraviolet radiation is coated with a coating, the coating comprising a metal oxide, or a photocatalyst, or a semiconductor, or any combination thereof.
    Type: Application
    Filed: June 26, 2013
    Publication date: October 31, 2013
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Arjen BOOGAARD, Timotheus Franciscus Sengers, Wilhelmus Sebastianus Marcus Maria Ketelaars, Carolus Ida Maria Antonius Spee
  • Publication number: 20130266727
    Abstract: A method is disclosed involving depositing a neutral orientation template layer onto a substrate after formation of chemical epitaxy or graphoepitaxy features on the substrate, but before deposition and orientation of a self-assemblable polymer. The orientation layer is arranged to bond with the substrate but not with certain features, so that it may be easily removed by vacuum or rinsing with organic solvent. The neutral orientation layer has a chemical affinity to match that of blocks in the self-assemblable polymer so that blocks of differing types wet the neutral orientation layer so that domains in the self-assembled polymer may lie side by side along the substrate surface, with interfaces normal to the substrate surface. The resulting aligned and oriented self-assembled polymer may itself be used as a resist for device lithography of the substrate.
    Type: Application
    Filed: December 9, 2011
    Publication date: October 10, 2013
    Inventors: Emiel Peeters, Wilhelmus Sebastianus Marcus Maria Ketelaars, Johan Frederik Dijksman, Sander Frederik Wuister, Roelof Koole, Christianus Martinus Van Heesch
  • Patent number: 8542341
    Abstract: An exposure apparatus includes a radiation system configured to supply a projection beam of radiation, and a patterning device configured to pattern the projection beam according to a desired pattern. The apparatus includes a substrate table having an area configured to support a substrate, and a projection system configured to project the patterned beam onto a target portion of the substrate. At least a part of the apparatus that during use of the apparatus is exposed to radiation is coated with a coating. The coating includes a metal oxide, or a photocatalyst, or a semiconductor, or any combination thereof.
    Type: Grant
    Filed: September 26, 2008
    Date of Patent: September 24, 2013
    Assignee: ASML Netherlands B.V.
    Inventors: Arjen Boogaard, Timotheus Franciscus Sengers, Wilhelmus Sebastianus Marcus Maria Ketelaars, Carolus Ida Maria Antonius Spee
  • Patent number: 7746375
    Abstract: A digital camera has a memory and a scan-mode. In this mode, the camera takes a sequence of still pictures. A next one of the pictures in the sequence is selected for being stored in the memory based on an amount of overlap regarding a picture content with a previous one of the pictures stored in the memory. The camera processes the pictures stored in the memory so as to create a composite picture.
    Type: Grant
    Filed: October 22, 2004
    Date of Patent: June 29, 2010
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Wilhelmus Sebastianus Marcus Maria Ketelaars, Arjen Boogaard
  • Publication number: 20090027642
    Abstract: An exposure apparatus includes a radiation system configured to supply a projection beam of radiation, and a patterning device configured to pattern the projection beam according to a desired pattern. The apparatus includes a substrate table having an area configured to support a substrate, and a projection system configured to project the patterned beam onto a target portion of the substrate. At least a part of the apparatus that during use of the apparatus is exposed to radiation is coated with a coating. The coating includes a metal oxide, or a photocatalyst, or a semiconductor, or any combination thereof.
    Type: Application
    Filed: September 26, 2008
    Publication date: January 29, 2009
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Arjen Boogaard, Timotheus Franciscus Sengers, Wilhelmus Sebastianus Marcus Maria Ketelaars, Carolus Ida Maria Spee
  • Patent number: 7450217
    Abstract: A coating for sensors and/or parts of an exposure apparatus, for example a sensor on a substrate table of a lithography apparatus, include a semiconductor, a photocatalyst, and/or a metal oxide.
    Type: Grant
    Filed: January 12, 2005
    Date of Patent: November 11, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Arjen Boogaard, Timotheus Franciscus Sengers, Wilhelmus Sebastianus Marcus Maria Ketelaars, Carolus Ida Maria Antonius Spee
  • Patent number: 7119353
    Abstract: The electric device (100) has a body (102) having a resistor (107) comprising a phase change material being changeable between a first phase and a second phase. The resistor (107) has a first electrical resistance when the phase change material is in the first phase, and a second electrical resistance, different from the first electrical resistance, when the phase change material is in the second phase. The phase change material constitutes a conductive path between a first contact area and a second contact area. A cross-section of the conductive path is smaller than the first contact area and the second contact area. The body (102) may further have a heating element 106 being able to conduct a current for enabling a transition from the first phase to the second phase. The heating element (106) is preferably arranged in parallel with the resistor (107).
    Type: Grant
    Filed: December 5, 2003
    Date of Patent: October 10, 2006
    Assignee: Koninklijke Phillips Electronics N.V.
    Inventors: Martijn Henri Richard Lankhorst, Franciscus Petrus Widdershoven, Robertus Adrianus Maria Wolters, Wilhelmus Sebastianus Marcus Maria Ketelaars, Erwin Rinaldo Meinders
  • Publication number: 20030150737
    Abstract: A pattern of very fine features (18) can be produced by illuminating an inorganic negative tone resist layer (16), provided on an electroplating base layer (14), by a beam (EB), which is able to cure the resist to a cured pattern according to the pattern to be formed, removing the non-illuminated portions of the resist layer and electroplating a layer (20) between the cured portions (18) of the resist layer.
    Type: Application
    Filed: October 14, 2002
    Publication date: August 14, 2003
    Inventors: Falco Cornelius Marinus Jacobus Maria Van Delft, Wilhelmus Sebastianus Marcus Maria Ketelaars, Mark Kroon