Patents by Inventor Wilhelmus Weekers

Wilhelmus Weekers has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8826719
    Abstract: A calibration artifact includes an elongated body made substantially entirely of ceramic material and having a direction of elongation. A plurality of measurement elements comprising the ceramic material are integrally formed with the elongated body, each measurement element comprising a first planar measurement surface facing in a first direction. The first planar measurement surface of each measurement element is parallel to the first planar measurement surface of each of the other measurement elements of the plurality of measurement elements. The calibration artifact may be a unitary step gauge formed with a single piece of ceramic material.
    Type: Grant
    Filed: December 14, 2011
    Date of Patent: September 9, 2014
    Assignee: Hexagon Metrology, Inc.
    Inventors: Wilhelmus Weekers, John Langlais, David Harvey, Peter Hicks
  • Patent number: 8352212
    Abstract: A manipulable aid which is separate and distinct from the probe of a CMM permits a CMM operator to more directly interact with a CMM measurement volume to align a workpiece, configure a measurement path, and/or program a dimensional metrology application.
    Type: Grant
    Filed: November 18, 2009
    Date of Patent: January 8, 2013
    Assignee: Hexagon Metrology, Inc.
    Inventors: William Fetter, Eric John Bennett, Wilhelmus Weekers, Gary W. Russell
  • Publication number: 20120151988
    Abstract: A calibration artifact includes an elongated body made substantially entirely of ceramic material and having a direction of elongation. A plurality of measurement elements comprising the ceramic material are integrally formed with the elongated body, each measurement element comprising a first planar measurement surface facing in a first direction. The first planar measurement surface of each measurement element is parallel to the first planar measurement surface of each of the other measurement elements of the plurality of measurement elements. The calibration artifact may be a unitary step gauge formed with a single piece of ceramic material.
    Type: Application
    Filed: December 14, 2011
    Publication date: June 21, 2012
    Applicant: Hexagon Metrology, Inc.
    Inventors: Wilhelmus Weekers, John Langlais, David Harvey, Peter Hicks
  • Publication number: 20110119025
    Abstract: A manipulable aid which is separate and distinct from the probe of a CMM permits a CMM operator to more directly interact with a CMM measurement volume to align a workpiece, configure a measurement path, and/or program a dimensional metrology application.
    Type: Application
    Filed: November 18, 2009
    Publication date: May 19, 2011
    Applicant: Hexagon Metrology, Inc.
    Inventors: WILLIAM FETTER, Eric John Bennett, Wilhelmus Weekers, Gary W. Russell
  • Publication number: 20050097766
    Abstract: A machine, such as a coordinate measuring machine, having an element and a structure movable with respect to each other along rails, wherein the rails have a different coefficient of thermal expansion than the structure to which they are attached. In one embodiment, a bar is disposed on the structure opposite the rails. This bar has a coefficient of thermal expansion, a stiffness, a spacing from the neutral axis of the structure, and a cross-sectional dimension such that the bar balances any thermal stresses in the structure caused by differential expansion or contraction of the structure and the rails with temperature changes to minimize any bending of the structure. In one embodiment, two rails are disposed on a beam, and a carriage travels on the two rails. For each rail, there is an associated bar disposed on an opposite surface of the beam. In another aspect, a pin extends into an elongated slot on a slide associated with the structure to allow the structure to expand and contact.
    Type: Application
    Filed: December 8, 2004
    Publication date: May 12, 2005
    Applicant: Hexagon Metrology AB
    Inventors: Wilhelmus Weekers, Jens Hupkau, David Payette