Patents by Inventor Wiliam P. LePera

Wiliam P. LePera has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Empirical determination of adapter affinity in high performance computing (HPC) environment
    Patent number: 9606837
    Abstract: A method, apparatus and program product utilize an empirical approach to determine the locations of one or more IO adapters in an HPC environment. Performance tests may be run using a plurality of candidate mappings that map IO adapters to various locations in the HPC environment, and based upon the results of such testing, speculative adapter affinity information may be generated that assigns one or more IO adapters to one or more locations to optimize adapter affinity performance for subsequently-executed tasks.
    Type: Grant
    Filed: October 31, 2014
    Date of Patent: March 28, 2017
    Assignee: International Business Machines Corporation
    Inventors: Wen C. Chen, Tsai-Yang Jea, Wiliam P. LePera, Hung Q. Thai, Hanhong Xue, Zhi Zhang
  • Empirical determination of adapter affinity in high performance computing (HPC) environment
    Patent number: 9495217
    Abstract: A method, apparatus and program product utilize an empirical approach to determine the locations of one or more IO adapters in an HPC environment. Performance tests may be run using a plurality of candidate mappings that map IO adapters to various locations in the HPC environment, and based upon the results of such testing, speculative adapter affinity information may be generated that assigns one or more IO adapters to one or more locations to optimize adapter affinity performance for subsequently-executed tasks.
    Type: Grant
    Filed: July 29, 2014
    Date of Patent: November 15, 2016
    Assignee: International Business Machines Corporation
    Inventors: Wen C. Chen, Tsai-Yang Jea, Wiliam P. LePera, Hung Q. Thai, Hanhong Xue, Zhi Zhang
  • EMPIRICAL DETERMINATION OF ADAPTER AFFINITY IN HIGH PERFORMANCE COMPUTING (HPC) ENVIRONMENT
    Publication number: 20160034313
    Abstract: A method, apparatus and program product utilize an empirical approach to determine the locations of one or more IO adapters in an HPC environment. Performance tests may be run using a plurality of candidate mappings that map IO adapters to various locations in the HPC environment, and based upon the results of such testing, speculative adapter affinity information may be generated that assigns one or more IO adapters to one or more locations to optimize adapter affinity performance for subsequently-executed tasks.
    Type: Application
    Filed: October 31, 2014
    Publication date: February 4, 2016
    Inventors: Wen C. Chen, Tsai-Yang Jea, Wiliam P. LePera, Hung Q. Thai, Hanhong Xue, Zhi Zhang
  • EMPIRICAL DETERMINATION OF ADAPTER AFFINITY IN HIGH PERFORMANCE COMPUTING (HPC) ENVIRONMENT
    Publication number: 20160034312
    Abstract: A method, apparatus and program product utilize an empirical approach to determine the locations of one or more IO adapters in an HPC environment. Performance tests may be run using a plurality of candidate mappings that map IO adapters to various locations in the HPC environment, and based upon the results of such testing, speculative adapter affinity information may be generated that assigns one or more IO adapters to one or more locations to optimize adapter affinity performance for subsequently-executed tasks.
    Type: Application
    Filed: July 29, 2014
    Publication date: February 4, 2016
    Inventors: Wen C. Chen, Tsai-Yang Jea, Wiliam P. LePera, Hung Q. Thai, Hanhong Xue, Zhi Zhang