Patents by Inventor Will Middelaer

Will Middelaer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050117162
    Abstract: A non-contact gauge and method of use is provided for optical measurement of an object or objects. The apparatus and methods may comprise a laser providing a projected laser beam; a work-piece holder for holding the object to be measured; a light sensitive sensor located to sense the beam as the beam is diffracted by at least one edge of the object and as the beam forms a near field Fresnel diffraction fringe pattern upon elements of the sensor. The laser and the sensor are located to enable near-field Fresnel diffraction. A fringe pattern signal analyzer may be included for computing mathematical algorithms to determine the position (X0) of at least one edge of the object based upon the diffraction pattern sensed by the sensor wherein the fringe pattern signal analyzer is structured to refine sensed fringe pattern edge position data to be more accurate based upon a theoretical diffraction compensation factor.
    Type: Application
    Filed: September 30, 2004
    Publication date: June 2, 2005
    Inventors: Bing Zhao, William Budleski, Will Middelaer, Kenneth Wendt