Abstract: The subject invention pertains to a methods and devices for ionizing a sample material. The subject invention also relates to an ionization source and to a method of sampling gas-phase ions from a sample. An ionization source in accordance with the subject invention can be used in conjunction with mass spectrometry or other sampling techniques. The subject invention can utilize a means for desorbing gas-phase ions and neutral molecules from a sample and a means to generate reagent ions where the reagent ions ionize the desorbed neutral molecules so as to increase the population of gas-phase ions. The subject invention can incorporate laser radiation for desorbing gas-phase ions and neutral molecules from a sample. In a specific embodiment, the subject invention provides an ionization source that uses a pulsed laser for desorption, so as to produce a population of desorbed neutral molecules from a sample, as well as a number of gas-phase sample ions.

Abstract: The subject invention pertains to a methods and devices for ionizing a sample material. The subject invention also relates to an ionization source and to a method of sampling gas-phase ions from a sample. An ionization source in accordance with the subject invention can be used in conjunction with mass spectrometry or other sampling techniques. The subject invention can utilize a means for desorbing gas-phase ions and neutral molecules from a sample and a means to generate reagent ions where the reagent ions ionize the desorbed neutral molecules so as to increase the population of gas-phase ions. The subject invention can incorporate laser radiation for desorbing gas-phase ions and neutral molecules from a sample. In a specific embodiment, the subject invention provides an ionization source that uses a pulsed laser for desorption, so as to produce a population of desorbed neutral molecules from a sample, as well as a number of gas-phase sample ions.