Patents by Inventor Willem E. Spaak

Willem E. Spaak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray examination system and method of controlling an exposure therein
    Patent number: 4747118
    Abstract: An X-ray examination system comprising an X-ray generator, an image intensifier tube connected to an output optical path and an X-ray exposure control arrangement which measures the light image intensity LI at the output of the image intensifier during fluoroscopy, and from the relationshipI.sub.EXP1 =(LA.times.I.sub.FL)/LI.times.T.sub.EXP),derives the exposure value I.sub.EXP1 of the switch-on tube current required to provide a desired exposure density during subsequent fluorography with a tube voltage V.sub.FL and exposure time T.sub.EXP, and wherein LA is a predetermined constant.
    Type: Grant
    Filed: April 25, 1986
    Date of Patent: May 24, 1988
    Assignee: U.S. Philips Corporation
    Inventor: Willem E. Spaak
  • Method of determining voltage and current for a given operating period of an X-ray source
    Patent number: 4638500
    Abstract: A method of determining the optimum values of voltage and current for operation of an X-ray source by choosing a point of intersection at the lowest voltage value of a curve representing an operating range limitation function of the X-ray source with a curve representing a current-voltage function that passes through a desired operating current value that is determined by means of one or more exposure measurements.
    Type: Grant
    Filed: February 19, 1976
    Date of Patent: January 20, 1987
    Assignee: U.S. Philips Corporation
    Inventors: Wigle F. Smits, Willem E. Spaak