Patents by Inventor Willem G. J. Langeveld

Willem G. J. Langeveld has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160341847
    Abstract: The present specification describes security systems for screening threats contained on persons, and more specifically, to an integrated detection system that is highly portable and that employs Enhanced Metal Detection (EMD) along with Advanced Imaging Technology (using backscatter X-ray scanning) to achieve Automated Threat Recognition (ATR) improvements. In particular, the present specification describes a modular inspection system for detecting objects carried by or on a human subject that includes a plurality of sections having an X-ray source, two backscatter X-ray detector panels and at least one metal detector panel; a first strapping means to hold together two of the plurality of sections that are folded and form a portable first case; and a second strapping means to hold together two of the plurality of sections that are folded and form a portable second case such that the first and second cases can be wheeled to and from a checkpoint.
    Type: Application
    Filed: July 15, 2013
    Publication date: November 24, 2016
    Applicant: Rapiscan Systems, Inc.
    Inventors: Luis E. Arroyo, Jr., Dan Strellis, Willem G. J. Langeveld
  • Patent number: 9435752
    Abstract: The present application discloses scanner systems that have a radiation generator arranged to generate radiation to irradiate an object, a detector arranged to detect the radiation after it has interacted with the object and generate a sequence of detector data sets as the object is moved relative to the generator, and processors arranged to process each of the detector data sets thereby to generate a control output.
    Type: Grant
    Filed: February 3, 2011
    Date of Patent: September 6, 2016
    Assignee: Rapiscan Systems, Inc.
    Inventors: Edward James Morton, Joseph Bendahan, Willem G. J. Langeveld
  • Publication number: 20160223706
    Abstract: The present specification discloses methods for inspecting liquids, aerosols and gels (LAGs) for threats. The method includes scanning LAGs packed in plastic bags in a multiple step process. In a primary scan, the bag is scanned using dual energy CT technique with fan beam radiation. In case of an alarm, the alarming LAG container is scanned again using coherent X-ray scatter technique with cone beam radiation. The system has a mechanism to switch between two collimators to produce either fan beam or cone beam. The system also has a mechanism to position the target properly for scanning and prevent container overlap when scanning multiple LAG containers in a bag.
    Type: Application
    Filed: January 14, 2016
    Publication date: August 4, 2016
    Inventors: Edward D. Franco, Willem G.J. Langeveld, Joseph Bendahan, Martin Janecek, Dan Strellis
  • Patent number: 9404875
    Abstract: The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.
    Type: Grant
    Filed: March 28, 2014
    Date of Patent: August 2, 2016
    Assignee: Rapiscan Systems, Inc.
    Inventor: Willem G. J. Langeveld
  • Patent number: 9052264
    Abstract: A scanner system comprises: a radiation generator arranged to generate radiation to irradiate an object, the radiation generator comprising a radiation source arranged to produce radiation and a filter arranged to provide variable filtering of the radiation from the source; a detector structure arranged to detect the radiation after it has interacted with the object and generate a sequence of detector data sets as the object is moved relative to the generator, and a processing system arranged to process each of the detector data sets thereby to generate a control output arranged to control the radiation generator so as to vary the filtering, thereby to vary the radiation output by the radiation generator as the object is scanned.
    Type: Grant
    Filed: August 3, 2012
    Date of Patent: June 9, 2015
    Assignee: Rapiscan Systems, Inc.
    Inventors: Joseph Bendahan, Willem G. J. Langeveld
  • Publication number: 20140341340
    Abstract: The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.
    Type: Application
    Filed: March 28, 2014
    Publication date: November 20, 2014
    Applicant: Rapiscan Systems, Inc.
    Inventor: Willem G.J. Langeveld
  • Publication number: 20140222402
    Abstract: The present specification discloses an X-ray scanning system having a shield surrounding an X-ray source of an X-ray inspection system, the shield comprising a first material or a combination of the first material and a second material; and a thickness that keeps a radiation dose below a predefined limit at a plurality of locations on a boundary of a defined exclusion zone, wherein the plurality of locations change as the X-ray source moves in a scan direction, and wherein the thickness of the shield varies non-uniformly as a function of a plurality of angles of radiation.
    Type: Application
    Filed: February 6, 2014
    Publication date: August 7, 2014
    Applicant: Rapiscan Systems, Inc.
    Inventors: Willem G.J. Langeveld, Edward D. Franco
  • Patent number: 8781067
    Abstract: The present application is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present application further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.
    Type: Grant
    Filed: April 10, 2013
    Date of Patent: July 15, 2014
    Assignee: Rapiscan Systems, Inc.
    Inventors: Willem G. J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg
  • Publication number: 20130129043
    Abstract: The present application discloses scanner systems that have a radiation generator arranged to generate radiation to irradiate an object, a detector arranged to detect the radiation after it has interacted with the object and generate a sequence of detector data sets as the object is moved relative to the generator, and processors arranged to process each of the detector data sets thereby to generate a control output.
    Type: Application
    Filed: February 3, 2011
    Publication date: May 23, 2013
    Inventors: Edward James Morton, Joseph Bendahan, Willem G.J. Langeveld
  • Patent number: 8437448
    Abstract: The present application is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present application further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.
    Type: Grant
    Filed: September 29, 2011
    Date of Patent: May 7, 2013
    Assignee: Rapiscan Systems, Inc.
    Inventors: Willem G. J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg
  • Publication number: 20120257719
    Abstract: The present application is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present application further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.
    Type: Application
    Filed: September 29, 2011
    Publication date: October 11, 2012
    Inventors: Willem G.J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg
  • Patent number: 8054937
    Abstract: The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present invention further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.
    Type: Grant
    Filed: June 12, 2009
    Date of Patent: November 8, 2011
    Assignee: Rapiscan Systems, Inc.
    Inventors: Willem G. J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg
  • Publication number: 20100034355
    Abstract: The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present invention further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.
    Type: Application
    Filed: June 12, 2009
    Publication date: February 11, 2010
    Inventors: Willem G.J. Langeveld, William A. Johnson, Roger D. Owen, Russell G. Schonberg