Abstract: The present disclosure provides systems and methods for inferring knowledge about manufacturing process metrics. In an aspect, the present disclosure provides a method for inferring knowledge about manufacturing process metrics. The method may comprise: (a) receiving one or more metrics associated with a manufacturing process; and (b) using a hierarchy of models to generate one or more inferences about the manufacturing process based on the one or more metrics, wherein the hierarchy of models comprises one or more individual models and one or more ensemble models configured to generate the one or more inferences based on a combination or an aggregation of outputs generated by the one or more individual models.

Abstract: The present disclosure provides systems and methods for analyzing runs. In an aspect, the present disclosure provides a method for extracting semantic artifacts from manufacturing data. The method may comprise: (a) receiving manufacturing data corresponding to a manufacturing process, wherein the manufacturing data comprises at least one of observation data, context data, temporal metric data, and/or overall equipment effectiveness (OEE) components associated with the manufacturing process; (b) extracting one or more semantic artifacts from the manufacturing data; and (c) using the one or more semantic artifacts to generate a summary representation of the manufacturing process.