Abstract: A method for fault tracing in automatically operating electronic measurement and test arrangements for a large number of electrochemical elements, wherein holders for the electrochemical elements are provided on the measurement and test arrangements and wherein cell simulators are provided with an external shape and size, including electrical connections, which approximately simulate one of the electrochemical elements to be tested, and contain test electronics, with a behaviour of the cell simulators with inverse polarity differing to a major extent from a behaviour with polarity based on the application, including the steps of inserting of the cell simulators into the holders, activating one of the cell simulators and applying a measurement current applied to it, measuring the voltage on the cell simulator and comparing the voltage with the nominal voltage predetermined for the cell simulator.

Abstract: In a method for fault tracing in automatically operating electronic measurement and test arrangements for a large number of electrochemical elements, cell simulators are inserted into the holders which are provided for the electrochemical elements. The external shape and size, including the electrical connections, of these cell simulators simulate an electrochemical element. They contain test electronics, whose behaviour with inverse polarity differs to a major extent from the behaviour with polarity based on the application. One cell simulator is activated and has a measurement current applied to it. The voltage and/or the voltage response on the cell simulator are/is then measured and are/is compared with the nominal voltage value predetermined for this cell simulator. The test electronics comprise at least a resistor and a diode connected in parallel.