Patents by Inventor William Adams Heindl

William Adams Heindl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for normalization and calibration of an imaging system using a variable thickness filter
    Patent number: 7519161
    Abstract: A system and method for calibrating a radiation imaging system include a dual use variable thickness radiation filter having a slit in one part thereof such that in a first position a radiation beam passing through is not attenuated and in a second position the radiation beam is attenuated according to the total filter thickness in the path of the radiation beam. The filter may be formed of multiple movable plates or a single piece of stepped high density material.
    Type: Grant
    Filed: March 16, 2007
    Date of Patent: April 14, 2009
    Assignee: Science Applications International Corporation
    Inventors: Steven Jon Horstman, William M. Fries, William Adams Heindl
  • System and method for normalization and calibration of an imaging system using a variable thickness filter
    Publication number: 20080226037
    Abstract: A system and method for calibrating a radiation imaging system include a dual use variable thickness radiation filter having a slit in one part thereof such that in a first position a radiation beam passing through is not attenuated and in a second position the radiation beam is attenuated according to the total filter thickness in the path of the radiation beam. The filter may be formed of multiple movable plates or a single piece of stepped high density material.
    Type: Application
    Filed: March 16, 2007
    Publication date: September 18, 2008
    Inventors: Steven Jon Horstman, William M. Fries, William Adams Heindl