Patents by Inventor William Alan Doolittle

William Alan Doolittle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250113507
    Abstract: An exemplary embodiment of the present disclosure provides a device, a substrate and a doped material. The doped material comprises a group III metal nitride, and one of a p-type dopant or an n-type dopant. The doped material is disposed upon the substrate at a temperature below 1000° C. and comprises an increased dopant concentration. Also disclosed herein are methods for producing doped group III metal nitride produces comprising flowing a plasma comprising nitrogen from a remote plasma chamber into a growth chamber; introducing a group III metal and at least one of a p-type dopant or an n-type dopant into the growth chamber; and disposing, over a substrate at a temperature below about 1000° C., a conductive group III metal nitride product comprising an increased electrical carrier concentration.
    Type: Application
    Filed: January 11, 2023
    Publication date: April 3, 2025
    Inventors: William Alan Doolittle, Habib Ahmad, Zachary P. Engel, Christopher M. Matthews, Keisuke Motoki, Alex S. Weidenbach
  • Patent number: 11319644
    Abstract: Systems and methods for the rapid growth of Group III metal nitrides using plasma assisted molecular beam epitaxy. The disclosure includes higher pressure and flow rates of nitrogen in the plasma, and the application of mixtures of nitrogen and an inert gas. Growth rates exceeding 8 ?m/hour can be achieved.
    Type: Grant
    Filed: January 6, 2020
    Date of Patent: May 3, 2022
    Assignee: Georgia Tech Research Corporation
    Inventors: William Alan Doolittle, Evan A. Clinton, Chloe A. M. Fabien, Brendan Patrick Gunning, Joseph J. Merola
  • Publication number: 20200141026
    Abstract: Systems and methods for the rapid growth of Group III metal nitrides using plasma assisted molecular beam epitaxy. The disclosure includes higher pressure and flow rates of nitrogen in the plasma, and the application of mixtures of nitrogen and an inert gas. Growth rates exceeding 8 ?m/hour can be achieved.
    Type: Application
    Filed: January 6, 2020
    Publication date: May 7, 2020
    Inventors: William Alan Doolittle, Evan A. Clinton, Chloe A.M. Fabien, Brendan Patrick Gunning, Joseph J. Merola
  • Patent number: 10526723
    Abstract: Systems and methods are disclosed for rapid growth of Group III metal nitrides using plasma assisted molecular beam epitaxy. The disclosure includes higher pressure and flow rates of nitrogen in the plasma, and the application of mixtures of nitrogen and an inert gas. Growth rates exceeding 8 ?m/hour can be achieved.
    Type: Grant
    Filed: June 16, 2016
    Date of Patent: January 7, 2020
    Assignee: Georgia Tech Research Corporation
    Inventors: William Alan Doolittle, Evan A. Clinton, Chloe A. M. Fabien, Brendan Patrick Gunning, Joseph J. Merola
  • Patent number: 10329688
    Abstract: An effusion cell includes a crucible for containing material to be evaporated or sublimated, a delivery tube configured to deliver evaporated or sublimated material originating from the crucible into a chamber, a supply tube extending from the crucible, the supply tube located and configured to trap condensate originating from the evaporated or sublimated material and to deliver the condensate back to the crucible, and at least one heating element located and configured to heat material in the crucible so as to cause evaporation or sublimation of the material and flow of the evaporated or sublimated material through the delivery tube and out from the effusion cell. The effusion cell is configured such that the crucible can be filled with the material to be evaporated or sublimated without removing the effusion cell from the process vacuum chamber. Semiconductor substrate processing systems may include such effusion cells.
    Type: Grant
    Filed: April 24, 2017
    Date of Patent: June 25, 2019
    Assignee: Innovative Advanced Materials, Inc.
    Inventor: William Alan Doolittle
  • Patent number: 10266962
    Abstract: A physical vapor deposition system includes a deposition chamber; a wafer support structure disposed within the deposition chamber and configured to support at least one wafer thereon, and at least one effusion cell disposed at least partially outside the deposition chamber and coupled to a wall of the deposition chamber. The at least one effusion cell is configured to generate physical vapor by evaporation or sublimation of material within the at least one effusion cell, and to inject the physical vapor into the deposition chamber through an aperture in the wall of the deposition chamber. The at least one effusion cell is configured such that the at least one effusion cell can be filled with the material to be evaporated or sublimated without removing the at least one effusion cell from the deposition chamber and without interrupting a deposition process performed using the deposition system.
    Type: Grant
    Filed: April 24, 2017
    Date of Patent: April 23, 2019
    Assignee: Innovative Advanced Materials, Inc.
    Inventor: William Alan Doolittle
  • Patent number: 10000381
    Abstract: Systems and methods for MBE growing of group-III Nitride alloys, comprising establishing an average reaction temperature range from about 250 C to about 850 C; introducing a nitrogen flux at a nitrogen flow rate; introducing a first metal flux at a first metal flow rate; and periodically stopping and restarting the first metal flux according to a first flow duty cycle. According to another embodiment, the system comprises a nitrogen source that provides nitrogen at a nitrogen flow rate, and, a first metal source comprising a first metal effusion cell that provides a first metal at a first metal flow rate, and a first metal shutter that periodically opens and closes according to a first flow duty cycle to abate and recommence the flow of the first metal from the first metal source. Produced alloys include AlN, InN, GaN, InGaN, and AlInGaN.
    Type: Grant
    Filed: September 21, 2015
    Date of Patent: June 19, 2018
    Assignee: Georgia Tech Research Corporation
    Inventors: Michael William Moseley, William Alan Doolittle
  • Publication number: 20180135202
    Abstract: Systems and methods are disclosed for rapid growth of Group III metal nitrides using plasma assisted molecular beam epitaxy. The disclosure includes higher pressure and flow rates of nitrogen in the plasma, and the application of mixtures of nitrogen and an inert gas. Growth rates exceeding 8 ?m/hour can be achieved.
    Type: Application
    Filed: June 16, 2016
    Publication date: May 17, 2018
    Inventors: William Alan Doolittle, Evan A. Clinton, Chloe A.M. Fabien, Brendan Patrick Gunning, Joseph J. Merola
  • Publication number: 20180118568
    Abstract: Systems and methods for MBE growing of group-III Nitride alloys, comprising establishing an average reaction temperature range from about 250 C to about 850 C; introducing a nitrogen flux at a nitrogen flow rate; introducing a first metal flux at a first metal flow rate; and periodically stopping and restarting the first metal flux according to a first flow duty cycle. According to another embodiment, the system comprises a nitrogen source that provides nitrogen at a nitrogen flow rate, and, a first metal source comprising a first metal effusion cell that provides a first metal at a first metal flow rate, and a first metal shutter that periodically opens and closes according to a first flow duty cycle to abate and recommence the flow of the first metal from the first metal source. Produced alloys include AN, InN, GaN, InGaN, and AlInGaN.
    Type: Application
    Filed: September 21, 2015
    Publication date: May 3, 2018
    Inventors: Michael William Moseley, William Alan Doolittle
  • Publication number: 20170306472
    Abstract: A physical vapor deposition system includes a deposition chamber; a wafer support structure disposed within the deposition chamber and configured to support at least one wafer thereon, and at least one effusion cell disposed at least partially outside the deposition chamber and coupled to a wall of the deposition chamber. The effusion cell is configured to generate physical vapor by evaporation or sublimation of material within the at least one effusion cell, and to inject the physical vapor into the deposition chamber through an aperture in the wall of the deposition chamber. The effusion cell is configured such that the effusion cell can be filled with the material to be evaporated or sublimated without removing the at least one effusion cell from the deposition chamber and without interrupting a deposition process performed using the deposition system.
    Type: Application
    Filed: April 24, 2017
    Publication date: October 26, 2017
    Inventor: William Alan Doolittle
  • Publication number: 20170306523
    Abstract: An effusion cell includes a crucible for containing material to be evaporated or sublimated, a delivery tube configured to deliver evaporated or sublimated material originating from the crucible into a chamber, a supply tube extending from the crucible, the supply tube located and configured to trap condensate originating from the evaporated or sublimated material and to deliver the condensate back to the crucible, and at least one heating element located and configured to heat material in the crucible so as to cause evaporation or sublimation of the material and flow of the evaporated or sublimated material through the delivery tube and out from the effusion cell. The effusion cell is configured such that the crucible can be filled with the material to be evaporated or sublimated without removing the effusion cell from the process vacuum chamber. Semiconductor substrate processing systems may include such effusion cells.
    Type: Application
    Filed: April 24, 2017
    Publication date: October 26, 2017
    Inventor: William Alan Doolittle
  • Publication number: 20160009556
    Abstract: Systems and methods for MBE growing of group-III Nitride alloys, comprising establishing an average reaction temperature range from about 250 C to about 850 C; introducing a nitrogen flux at a nitrogen flow rate; introducing a first metal flux at a first metal flow rate; and periodically stopping and restarting the first metal flux according to a first flow duty cycle. According to another embodiment, the system comprises a nitrogen source that provides nitrogen at a nitrogen flow rate, and, a first metal source comprising a first metal effusion cell that provides a first metal at a first metal flow rate, and a first metal shutter that periodically opens and closes according to a first flow duty cycle to abate and recommence the flow of the first metal from the first metal source. Produced alloys include AN, InN, GaN, InGaN, and AlInGaN.
    Type: Application
    Filed: September 21, 2015
    Publication date: January 14, 2016
    Inventors: Michael William Moseley, William Alan Doolittle
  • Publication number: 20160010221
    Abstract: Metal oxide structures, devices, and fabrication methods are provided. In addition, applications of such structures, devices, and methods are provided. In some embodiments, an oxide material can include a substrate and a single-crystal epitaxial layer of an oxide composition disposed on a surface of the substrate, where the oxide composition is represented by ABO2 such that A is a lithium cation, B is a cation selected from the group consisting of trivalent transition metal cations, trivalent lanthanide cations, trivalent actinide cations, trivalent p-block cations, and combinations thereof, and O is an oxygen anion. The ABO2 can be a high purity ABO2, with less than 1 atom % each of sodium, carbon, boron, and fluorine. The ABO2 can be prepared by a liquid phase electro-epitaxy using a molten solution of a metal oxide and LiBO2.
    Type: Application
    Filed: March 3, 2015
    Publication date: January 14, 2016
    Inventors: William Alan Doolittle, Chloe A. M. Fabien, Jordan Douglas Greenlee, Brendan Patrick Gunning, Joshua C. Shank, Marshall B. Tellekamp, JR.
  • Patent number: 9142413
    Abstract: Systems and methods for MBE growing of group-III Nitride alloys, comprising establishing an average reaction temperature range from about 250 C to about 850 C; introducing a nitrogen flux at a nitrogen flow rate; introducing a first metal flux at a first metal flow rate; and periodically stopping and restarting the first metal flux according to a first flow duty cycle. According to another embodiment, the system comprises a nitrogen source that provides nitrogen at a nitrogen flow rate, and, a first metal source comprising a first metal effusion cell that provides a first metal at a first metal flow rate, and a first metal shutter that periodically opens and closes according to a first flow duty cycle to abate and recommence the flow of the first metal from the first metal source. Produced alloys include AlN, InN, GaN, InGaN, and AlInGaN.
    Type: Grant
    Filed: November 8, 2011
    Date of Patent: September 22, 2015
    Assignee: GEORGIA TECH RESEARCH CORPORATION
    Inventors: Michael William Moseley, William Alan Doolittle
  • Publication number: 20130244408
    Abstract: Systems and methods for MBE growing of group-III Nitride alloys, comprising establishing an average reaction temperature range from about 250 C to about 850 C; introducing a nitrogen flux at a nitrogen flow rate; introducing a first metal flux at a first metal flow rate; and periodically stopping and restarting the first metal flux according to a first flow duty cycle. According to another embodiment, the system comprises a nitrogen source that provides nitrogen at a nitrogen flow rate, and, a first metal source comprising a first metal effusion cell that provides a first metal at a first metal flow rate, and a first metal shutter that periodically opens and closes according to a first flow duty cycle to abate and recommence the flow of the first metal from the first metal source. Produced alloys include AlN, InN, GaN, InGaN, and AlInGaN.
    Type: Application
    Filed: November 8, 2011
    Publication date: September 19, 2013
    Applicant: GEORGIA TECH RESEARCH CORPORATION
    Inventors: Michael William Moseley, William Alan Doolittle
  • Publication number: 20110061726
    Abstract: This invention relates to a high efficiency solar cell with a novel architecture. In one embodiment, the solar cell is comprised of a high energy gap cell stack and a dichroic mirror. The high energy gap cell stack is exposed to solar light before there is any splitting of the solar light into spectral components. Each cell in the high energy gap cell stack absorbs the light with photons of energy greater than or equal to its energy gap, i.e., the blue-green to ultraviolet portion of the solar light. Each cell in the high energy gap cell stack is transparent to and transmits light with photons of energy less than its energy gap. Spectral splitting is then performed by means of the dichroic mirror on the remaining light, i.e., the light transmitted by the high energy gap cell stack.
    Type: Application
    Filed: November 17, 2010
    Publication date: March 17, 2011
    Inventors: Allen M. Barnett, David Emil Carlson, William Alan Doolittle, Christiana Beatrice Honsberg, Douglas Andrew Kirkpatrick
  • Patent number: 7888669
    Abstract: A light-emitting nitride/zinc oxide based compound semiconductor device of double heterostructure. The double-heterostructure includes a light-emitting layer formed of an Al1-x-yInxGayN; 0?x<1, 0<y?1, and x+y=0.1 to 1 compound semiconductor doped an impurity. Single or multi quantum well light-emitting active layers Al1-x-yInxGayN/GaN; 0?x<1, 0<y?1, and x+y=0.1 to 1 are positioned between p-type GaN and n-type ZnO substrates.
    Type: Grant
    Filed: April 1, 2008
    Date of Patent: February 15, 2011
    Assignee: Georgia Tech Research Corporation
    Inventors: Gon Namkoong, William Alan Doolittle
  • Publication number: 20090314332
    Abstract: This invention relates to a high efficiency solar cell with a novel architecture. In one embodiment, the solar cell is comprised of a high energy gap cell stack and a dichroic mirror. The high energy gap cell stack is exposed to solar light before there is any splitting of the solar light into spectral components. Each cell in the high energy gap cell stack absorbs the light with photons of energy greater than or equal to its energy gap, i.e., the blue-green to ultraviolet portion of the solar light. Each cell in the high energy gap cell stack is transparent to and transmits light with photons of energy less than its energy gap. Spectral splitting is then performed by means of the dichroic mirror on the remaining light, i.e., the light transmitted by the high energy gap cell stack.
    Type: Application
    Filed: January 23, 2009
    Publication date: December 24, 2009
    Inventors: Allen M. Barnett, David Emil Carlson, William Alan Doolittle, Christiana Beatrice Honsberg, Douglas Andrew Kirkpatrick
  • Publication number: 20080179587
    Abstract: A light-emitting nitride/zinc oxide based compound semiconductor device of double heterostructure. The double-heterostructure includes a light-emitting layer formed of an Al1-x-yInxGayN; 0?x<1, 0<y?1, and x+y=0.1 to 1 compound semiconductor doped an impurity. Single or multi quantum well light-emitting active layers Al1-x-yInxGayN/GaN; 0?x<1, 0<y?1, and x+y=0.1 to 1 are positioned between p-type GaN and n-type ZnO substrates.
    Type: Application
    Filed: April 1, 2008
    Publication date: July 31, 2008
    Applicant: GEORGIA TECH RESEARCH CORPORATION
    Inventors: Gon Namkoong, William Alan Doolittle
  • Patent number: 7173286
    Abstract: Semiconductor devices formed by depositing III-nitride compounds on lithium niobate and/or lithium tantalate substrates are disclosed. Also disclosed, are semiconductor devices formed by depositing lithium niobate and/or lithium tantalate on III-Nitrides and Silicon Carbide substrates. The semiconductor devices provide good lattice matching characteristics between the substrate and the material that is deposited upon the substrate. The method of forming such semiconductor devices, which is also disclosed, enables fabrication of periodically-poled devices in a manner that is advantageous in comparison to existing technologies.
    Type: Grant
    Filed: February 14, 2003
    Date of Patent: February 6, 2007
    Assignee: Georgia Tech Research Corporation
    Inventor: William Alan Doolittle