Patents by Inventor William Albert Lloyd

William Albert Lloyd has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Cell-aware defect characterization and waveform analysis using multiple strobe points
    Patent number: 10515167
    Abstract: A computer-implemented method for characterizing a circuit is presented. The method includes receiving, by the computer, data representative of the circuit and at least one defect of the circuit. The method further includes simulating, using the computer, the circuit to obtain a first timing characteristic, and simulating, using the computer, the circuit with the at least one defect to obtain a second timing characteristic. The method further includes identifying, using the computer, an association between at least one test vector and the at least one defect in accordance with the first timing characteristic, the second timing characteristic, and a multitude of strobes applied during a first time interval associated with the at least one test vector, when the computer is invoked to characterize the circuit.
    Type: Grant
    Filed: August 5, 2016
    Date of Patent: December 24, 2019
    Assignee: SYNOPSYS, INC.
    Inventors: Ruifeng Guo, Brian Matthew Archer, William Albert Lloyd, Christopher Kevin Allsup, Xiaolei Cai, Kevin Chau
  • CELL-AWARE DEFECT CHARACTERIZATION AND WAVEFORM ANALYSIS USING MULTIPLE STROBE POINTS
    Publication number: 20180039721
    Abstract: A computer-implemented method for characterizing a circuit is presented. The method includes receiving, by the computer, data representative of the circuit and at least one defect of the circuit. The method further includes simulating, using the computer, the circuit to obtain a first timing characteristic, and simulating, using the computer, the circuit with the at least one defect to obtain a second timing characteristic. The method further includes identifying, using the computer, an association between at least one test vector and the at least one defect in accordance with the first timing characteristic, the second timing characteristic, and a multitude of strobes applied during a first time interval associated with the at least one test vector, when the computer is invoked to characterize the circuit.
    Type: Application
    Filed: August 5, 2016
    Publication date: February 8, 2018
    Inventors: Ruifeng Guo, Brian Matthew Archer, William Albert Lloyd, Christopher Kevin Allsup, Xiaolei Cai, Kevin Chau