Patents by Inventor William B. Maxwell

William B. Maxwell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Secondary electron detector for use in a gaseous atmosphere
    Patent number: 4880976
    Abstract: The invention provides for a device for generating, amplifying and detecting secondary electrons from a surface of a sample. The device may comprise a scanning electron microscope. The invention also provides for a method for generating, amplifying and detecting secondary electrons from a surface of a sample.
    Type: Grant
    Filed: November 10, 1988
    Date of Patent: November 14, 1989
    Assignee: ElectroScan Corporation
    Inventors: James F. Mancuso, William B. Maxwell, Gerasimos D. Danilatos
  • Secondary electron detector for use in a gaseous atmosphere
    Patent number: 4785182
    Abstract: The invention provides for a device for generating, amplifying and detecting secondary electrons from a surface of a sample. The device may comprise a scanning electron microscope. The invention also provides for a method for generating, amplifying and detecting secondary electrons from a surface of a sample.
    Type: Grant
    Filed: May 21, 1987
    Date of Patent: November 15, 1988
    Assignee: ElectroScan Corporation
    Inventors: James F. Mancuso, William B. Maxwell, Gerasimos D. Danilatos