Patents by Inventor William Barrett, III

William Barrett, III has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11646805
    Abstract: A measurement system utilizing metasurfaces and compressive sensing is provided that measures specular and diffuse RF reflection properties of a sample omnidirectionally across a broad frequency regime in a monostatic, bistatic, or BRDF sense. The measurement system may be used to measure the full hemispherical (or spherical) reflection from a target that has been illuminated in a monostatic or bistatic case. The measurement system may also be used to measure the full BRDF of a sample or spatially complex bistatic reflections from a sample.
    Type: Grant
    Filed: July 27, 2020
    Date of Patent: May 9, 2023
    Assignee: Raytheon Company
    Inventors: Scott R. Sorbel, Clayton Spann, Robert D. Johnson, James A. McDaniel, William Barrett, III, Peter S. Ford
  • Publication number: 20220029714
    Abstract: A measurement system utilizing metasurfaces and compressive sensing is provided that measures specular and diffuse RF reflection properties of a sample omnidirectionally across a broad frequency regime in a monostatic, bistatic, or BRDF sense. The measurement system may be used to measure the full hemispherical (or spherical) reflection from a target that has been illuminated in a monostatic or bistatic case. The measurement system may also be used to measure the full BRDF of a sample or spatially complex bistatic reflections from a sample.
    Type: Application
    Filed: July 27, 2020
    Publication date: January 27, 2022
    Inventors: Scott R. Sorbel, Clayton Spann, Robert D. Johnson, James A. McDaniel, William Barrett, III, Peter S. Ford