Patents by Inventor William C. Chapman
William C. Chapman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12271960Abstract: An energy management system interoperates with an automation system to provide integrated control over essentially all power-consuming, power-generating, and power storage devices in a home or other environment. The energy management system provides configurable energy management scenes in which one or more values, each representing a desired operating condition, are associated with some or all of the loads of a home, business or other environment. Different energy management scenes may be configured for different environmental conditions including season, day of week, time of day, grid status, battery condition, and generator condition among others.Type: GrantFiled: September 11, 2020Date of Patent: April 8, 2025Assignee: Savant Systems, Inc.Inventors: Robert P. Madonna, Anna E. Demeo, William H. Dillon, Daniel H. Chapman, Kevin C. Kicklighter
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Patent number: 7072707Abstract: A method and apparatus for collecting and processing physical space data used while performing image-guided surgery is disclosed. Physical space data is collected by probing physical surface points of surgically exposed tissue. The physical space data provides three-dimensional (3-D) coordinates for each of the physical surface points. Based on the physical space data collected, point-based registrations used to indicate surgical position in both image space and physical space are determined. In one embodiment, the surface of surgically exposed tissue of a living patient is illuminated with laser light. Light reflected from the illuminated surface of the exposed tissue is received and analyzed. In another embodiment, one or more magnetic fields of known shape and size are established in the proximity of the exposed tissue. Data associated with the strength of the magnetic fields is acquired and analyzed.Type: GrantFiled: April 16, 2003Date of Patent: July 4, 2006Assignee: Vanderbilt UniversityInventors: Robert L. Galloway, Jr., William C. Chapman, James D. Stefansic, Alan J. Herline, Michael I. Miga, David M. Cash, Tuhin K. Sinha
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Publication number: 20040019274Abstract: A method and apparatus for collecting and processing physical space data used while performing image-guided surgery is disclosed. Physical space data is collected by probing physical surface points of surgically exposed tissue. The physical space data provides three-dimensional (3-D) coordinates for each of the physical surface points. Based on the physical space data collected, point-based registrations used to indicate surgical position in both image space and physical space are determined. In one embodiment, the surface of surgically exposed tissue of a living patient is illuminated with laser light. Light reflected from the illuminated surface of the exposed tissue is received and analyzed. In another embodiment, one or more magnetic fields of known shape and size are established in the proximity of the exposed tissue. Data associated with the strength of the magnetic fields is acquired and analyzed.Type: ApplicationFiled: April 16, 2003Publication date: January 29, 2004Applicant: Vanderbilt UniversityInventors: Robert L. Galloway, William C. Chapman, James D. Stefansic, Alan J. Herline, Michael I. Miga, David M. Cash, Tuhin K. Sinha
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Patent number: 6584339Abstract: A method and apparatus for collecting and processing physical space data used while performing image-guided surgery is disclosed. Physical space data is collected by probing physical surface points of surgically exposed tissue. The physical space data provides three-dimensional (3-D) coordinates for each of the physical surface points. Based on the physical space data collected, point-based registrations used to indicate surgical position in both image space and physical space are determined. The registrations are used to map into image space, image data describing the physical space of an ablative instrument used to perform the image-guided surgery, an ablation zone of the instrument, the surgically exposed tissue, and a particular portion of the tissue to be resected or ablated. The image data is updated on a periodic basis.Type: GrantFiled: June 27, 2001Date of Patent: June 24, 2003Assignee: Vanderbilt UniversityInventors: Robert L. Galloway, Jr., William C. Chapman, James D. Stefansic, Alan J. Herline, Candice D. Pinson
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Publication number: 20030000535Abstract: A method and apparatus for collecting and processing physical space data used while performing image-guided surgery is disclosed. Physical space data is collected by probing physical surface points of surgically exposed tissue. The physical space data provides three-dimensional (3-D) coordinates for each of the physical surface points. Based on the physical space data collected, point-based registrations used to indicate surgical position in both image space and physical space are determined. The registrations are used to map into image space, image data describing the physical space of an ablative instrument used to perform the image-guided surgery, an ablation zone of the instrument, the surgically exposed tissue, and a particular portion of the tissue to be resected or ablated. The image data is updated on a periodic basis.Type: ApplicationFiled: June 27, 2001Publication date: January 2, 2003Applicant: Vanderbilt UniversityInventors: Robert L. Galloway, William C. Chapman, James D. Stefansic, Alan J. Herline, Candice D. Pinson
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Patent number: 5472774Abstract: A photolithography test structure is provided for measuring the amount of notching associated with photolithography processing. The test structure includes a curved insulating structure placed in close spaced proximity with a conductive, interconnect structure. A pair of conductive pads are deposited at opposite ends of the interconnect structure for measuring the resistance through the interconnect. Depending upon the amount of notching associated with the interconnect, resistance readings will vary. Test areas containing notched interconnect can be compared with controlled areas specifically designed not to have notching in order to determine relative changes in resistance, and to correlate that resistance with notching magnitude. The insulating structure, interconnect structure and conductive pads are processed upon the same substrate material containing the resulting product requiring testing.Type: GrantFiled: August 19, 1994Date of Patent: December 5, 1995Assignee: Advanced Micro DevicesInventors: Howard S. Goad, Derick J. Wristers, James H. Hussey, Jr., Michael A. Hillis, William C. Chapman
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Patent number: 5370923Abstract: A photolithography test structure is provided for measuring the amount of notching associated with photolithography processing. The test structure includes a curved insulating structure placed in close spaced proximity with a conductive, interconnect structure. A pair of conductive pads are deposited at opposite ends of the interconnect structure for measuring the resistance through the interconnect. Depending upon the amount of notching associated with the interconnect, resistance readings will vary. Test areas containing notched interconnect can be compared with controlled areas specifically designed not to have notching in order to determine relative changes in resistance, and to correlate that resistance with notching magnitude. The insulating structure, interconnect structure and conductive pads are processed upon the same substrate material containing the resulting product requiring testing.Type: GrantFiled: February 26, 1993Date of Patent: December 6, 1994Assignee: Advanced Micro Devices, Inc.Inventors: Howard S. Goad, Derick J. Wristers, James H. Hussey, Jr., Michael A. Hillis, William C. Chapman
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Patent number: 5040439Abstract: This application discloses an improvement for a conventional open-end adjustable wrench comprising a recess in the movable jaw of the wrench adapted to receive the first end of a chain. Spring biasing means on the first end of the chain to releasably retain the first end of the chain in the recess and a curved lip on the fixed jaw adapted to receive and retain the opposite second end of the chain are also disclosed. Finally, a ratchet-like motion achieved by the modified wrench is disclosed wherein the work object is engaged in a non-slip manner during the movement of the wrench handle in one direction, and in a slipping manner during the movement of the wrench handle in the opposite direction. The unique refined feature of maximum adjustment provided by the flexible movement of the wrench jaw being repositioned where the knurl is moved allows the full ratchet-like action motion to be applied to the work object.Type: GrantFiled: March 9, 1989Date of Patent: August 20, 1991Inventor: William C. Chapman
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Patent number: 4794824Abstract: An improved and simplified vice-locking adjustable end wrench with a primary handle whose jaws are manually adjustable by a customary knurled worm gear for initial adjustment, and a simple, single clamping and gripping pivotal handle relative to the usual handle and secured at one end at the jaws and freely extending to the end of the handle to achieve a vice-like gripping action with maximum desired mechanical advantage and force when the handles are forced together to an adjustable extent in a nested relationship so that the clamping handle can effectively carry the initial wrench closing forces.Type: GrantFiled: June 5, 1987Date of Patent: January 3, 1989Inventor: William C. Chapman