Abstract: A voltage source device, including a first voltage source configured to output a first voltage, source pathways to connect the first voltage source to a device under test, sensing pathways electrically coupled to the device under test; and circuitry configured to sample a second voltage at the device under test, determine a voltage difference between the first voltage and the second voltage, and adjust the first voltage based on the difference between the first voltage and the second voltage.

Abstract: A test and measurement instrument including a voltage source configured to output a source voltage, a current sensor, and one or more processors. The one or more processors are configured to determine an estimation of a load of an unknown connected device under test based on the source voltage, the current sensor, and a voltage of the connected device under test without any prior knowledge of the connected device under test.

Abstract: A test and measurement instrument including a voltage source configured to output a source voltage, a current sensor, and one or more processors. The one or more processors are configured to determine an estimation of a load of an unknown connected device under test based on the source voltage, the current sensor, and a voltage of the connected device under test without any prior knowledge of the connected device under test.

Abstract: A configurable instrument includes a mainframe having one or more processors, a chassis having slots to accept one or more instrument modules, a communication bus coupled to all of the instrument modules inserted in the slots, and a communication backplane, separate from the communication bus, and configured to allow point-to-point communication between any pair of modules inserted in the slots.

Abstract: A voltage source device, including a first voltage source configured to output a first voltage, source pathways to connect the first voltage source to a device under test, sensing pathways electrically coupled to the device under test; and circuitry configured to sample a second voltage at the device under test, determine a voltage difference between the first voltage and the second voltage, and adjust the first voltage based on the difference between the first voltage and the second voltage.

Abstract: A test and measurement instrument including a voltage source configured to output a source voltage, a current sensor, and one or more processors. The one or more processors are configured to determine an estimation of a load of an unknown connected device under test based on the source voltage, the current sensor, and a voltage of the connected device under test without any prior knowledge of the connected device under test.

Abstract: A digital-to-analog converter, including an input to receive a digital signal; a first comparator configured to receive the digital signal and output a first signal based on the digital signal and a first threshold; a second comparator configured to receive the digital signal and output a second signal based on the digital signal and a second threshold, the second threshold different from the first threshold; and an integrator configured to receive the first signal and the second signal and integrate the first signal and the second signal into an analog signal that represents the digital signal.