Patents by Inventor William Chiu-Ting Shu

William Chiu-Ting Shu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8407655
    Abstract: Systems and techniques for fixing design requirement violations in a circuit design in multiple scenarios are described. During operation, a system can receive a scenario image and a multi-scenario ECO database. The scenario image can store parameter values for circuit objects in a scenario, and the multi-scenario ECO database can store a subset of parameter values for a subset of circuit objects in multiple scenarios. Next, the system can determine an engineering change order to fix one or more design requirement violations, which can involve estimating parameter values for circuit objects in multiple scenarios using parameter values stored in the scenario image and the multi-scenario ECO database.
    Type: Grant
    Filed: November 18, 2010
    Date of Patent: March 26, 2013
    Assignee: Synopsys, Inc.
    Inventors: Nahmsuk Oh, Rupesh Nayak, William Chiu-Ting Shu
  • Patent number: 8336013
    Abstract: Some embodiments of the present invention provide techniques and systems for determining an order for visiting circuit blocks of a circuit design for fixing design requirement violations. Fixing design requirement violations by visiting circuit blocks in this order can improve performance and quality of results. During operation, a system can determine a set of equal value segments in the circuit design. In some embodiments, the system determines equal value segments for multiple corners and combines the equal value segments to obtain the set of equal value segments. Next, the system can determine an order for visiting circuit blocks of the circuit design for fixing design requirement violations based at least on the set of equal value segments. Note that circuit block pins in an equal value segment are associated with the same parameter value, and parameter values indicate an amount or degree of a design requirement violation.
    Type: Grant
    Filed: January 22, 2010
    Date of Patent: December 18, 2012
    Assignee: Synopsys, Inc.
    Inventors: Nahmsuk Oh, Peivand Tehrani, William Chiu-Ting Shu
  • Patent number: 8321824
    Abstract: Embodiments of a computer system, a method, an integrated circuit and a computer-program product (i.e., software) for use with the computer system are described. These devices and techniques may be used to perform STA for circuits that include multiple power domains. Power-domain crossing information and optionally the delay in each power domain can be propagated during the full circuit graph-based STA to accurately perform STA without enumerating all paths. Some embodiments can use a tag-based engine to track power-domain crossing(s) during graph-based STA. If a power-domain is crossed in a path, pessimism may be added to the cumulative delay at the end point of the path. For those paths that do not cross a power domain, pessimism may be removed from the cumulative delay at their end points. In some embodiments, pessimism may be removed from the cumulative delay at end points for paths that cross power domains.
    Type: Grant
    Filed: April 30, 2009
    Date of Patent: November 27, 2012
    Assignee: Synopsys, Inc.
    Inventors: Jindrich Zejda, William Chiu-Ting Shu, Khalid Rahmat, Feroze Taraporevala
  • Publication number: 20120131525
    Abstract: Systems and techniques for fixing design requirement violations in a circuit design in multiple scenarios are described. During operation, a system can receive a scenario image and a multi-scenario ECO database. The scenario image can store parameter values for circuit objects in a scenario, and the multi-scenario ECO database can store a subset of parameter values for a subset of circuit objects in multiple scenarios. Next, the system can determine an engineering change order to fix one or more design requirement violations, which can involve estimating parameter values for circuit objects in multiple scenarios using parameter values stored in the scenario image and the multi-scenario ECO database.
    Type: Application
    Filed: November 18, 2010
    Publication date: May 24, 2012
    Applicant: SYNOPSYS, INC.
    Inventors: Nahmsuk Oh, Rupesh Nayak, William Chiu-Ting Shu
  • Publication number: 20110185335
    Abstract: Some embodiments of the present invention provide techniques and systems for determining an order for visiting circuit blocks of a circuit design for fixing design requirement violations. Fixing design requirement violations by visiting circuit blocks in this order can improve performance and quality of results. During operation, a system can determine a set of equal value segments in the circuit design. In some embodiments, the system determines equal value segments for multiple corners and combines the equal value segments to obtain the set of equal value segments. Next, the system can determine an order for visiting circuit blocks of the circuit design for fixing design requirement violations based at least on the set of equal value segments. Note that circuit block pins in an equal value segment are associated with the same parameter value, and parameter values indicate an amount or degree of a design requirement violation.
    Type: Application
    Filed: January 22, 2010
    Publication date: July 28, 2011
    Applicant: SYNOPSYS, INC.
    Inventors: Nahmsuk Oh, Peivand Tehrani, William Chiu-Ting Shu
  • Publication number: 20100281444
    Abstract: Embodiments of a computer system, a method, an integrated circuit and a computer-program product (i.e., software) for use with the computer system are described. These devices and techniques may be used to perform STA for circuits that include multiple power domains. Power-domain crossing information and optionally the delay in each power domain can be propagated during the full circuit graph-based STA to accurately perform STA without enumerating all paths. Some embodiments can use a tag-based engine to track power-domain crossing(s) during graph-based STA. If a power-domain is crossed in a path, pessimism may be added to the cumulative delay at the end point of the path. For those paths that do not cross a power domain, pessimism may be removed from the cumulative delay at their end points. In some embodiments, pessimism may be removed from the cumulative delay at end points for paths that cross power domains.
    Type: Application
    Filed: April 30, 2009
    Publication date: November 4, 2010
    Applicant: SYNOPSYS, INC.
    Inventors: Jindrich Zejda, William Chiu-Ting Shu, Khalid Rahmat, Feroze Taraporevala
  • Patent number: 7263676
    Abstract: One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.
    Type: Grant
    Filed: April 9, 2003
    Date of Patent: August 28, 2007
    Assignee: Synopsys, Inc.
    Inventors: Alexander Gyure, Jindrich Zejda, Peivand Fallah-Tehrani, Wenyuan Wang, Chi-Chong Lo, Seyed Alireza Kasnavi, Mahmoud Shahram, Yansheng Luo, William Chiu-Ting Shu
  • Patent number: 7007252
    Abstract: One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the input noise signals, and stores a representation of the responses. This allows a subsequent analysis operation to access the stored representation to determine a response of the cell instead of having to perform a time-consuming simulation operation.
    Type: Grant
    Filed: April 9, 2003
    Date of Patent: February 28, 2006
    Assignee: Synopsys, Inc.
    Inventors: Alexander Gyure, Jindrich Zejda, Peivand Fallah-Tehrani, Wenyuan Wang, Chi-Chong Lo, Mahmoud Shahram, Yansheng Luo, William Chiu-Ting Shu, Seyed Alireza Kasnavi
  • Publication number: 20040205682
    Abstract: One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.
    Type: Application
    Filed: April 9, 2003
    Publication date: October 14, 2004
    Inventors: Alexander Gyure, Jindrich Zejda, Peivand Fallah-Tehrani, Wenyuan Wang, Chi-Chong Lo, Seyed Alireza Kasnavi, Mahmoud Shahram, Yansheng Luo, William Chiu-Ting Shu
  • Publication number: 20040205680
    Abstract: One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the input noise signals, and stores a representation of the responses. This allows a subsequent analysis operation to access the stored representation to determine a response of the cell instead of having to perform a time-consuming simulation operation.
    Type: Application
    Filed: April 9, 2003
    Publication date: October 14, 2004
    Applicant: Entire Interest
    Inventors: Alexander Gyure, Jindrich Zejda, Peivand Fallah-Tehrani, Wenyuan Wang, Chi-Chong Lo, Mahmoud Shahram, Yansheng Luo, William Chiu-Ting Shu, SEYED ALIREZA KASNAVI