Abstract: Tamper-indicating systems are disclosed that indicate tampering upon tampering of the system that causes a chemical reaction between an oxygen-sensitive chemical compound and oxygen that react upon tampering.

Abstract: The present invention stands directed at polymer derived ceramic material. More specifically, boric acid and 2,4,6-trimethyl-2,4-6-trivinylsilazane are reacted to form a polymeric resin followed by the addition of a crosslinking agent and then subsequent crosslinking and pyrolysis to provide an improved ceramic yield.

Abstract: The present disclosure is directed to systems, methods and tools that measure ionic concentrations and downhole enthalpy of a flowing geothermal fluid in real-time at high-temperature and pressure. The systems, methods and tools include measuring the concentration of selected naturally occurring ions found in the liquid phase of the geothermal fluid throughout the wellbore using novel electrochemical sensor technologies. The change in liquid-phase ion concentration will be used to calculate the proportion of liquid to steam and allow for accurate enthalpy measurements. The techniques and technologies described here can be applied to any application of electrochemical sensing in extreme environments.

Abstract: The present disclosure is directed to systems, methods and tools that measure ionic concentrations and downhole enthalpy of a flowing geothermal fluid in real-time at high-temperature and pressure. The systems, methods and tools include measuring the concentration of selected naturally occurring ions found in the liquid phase of the geothermal fluid throughout the wellbore using novel electrochemical sensor technologies. The change in liquid-phase ion concentration will be used to calculate the proportion of liquid to steam and allow for accurate enthalpy measurements. The techniques and technologies described here can be applied to any application of electrochemical sensing in extreme environments.

Abstract: Memory array repair where the repair logic cannot operate at the same operating condition as the memory array is disclosed. In one embodiment, a test is run with the memory array configured in a first operating condition that repair logic for the memory array cannot achieve, and test data is accumulated from the test in the memory array. The memory array is then read with the memory array configured in a second operating condition that the repair logic can achieve using the test data from the test at the first operating condition. As a result, repairs can be achieved even though the repair logic is incapable of operating at the same condition as the memory array. A method, test unit and integrated circuit implementing the testing are disclosed.

Abstract: A method and system for testing a DRAM comprised of DRAM blocks. The method comprises: in a processor based built-in self test system, generating a test data pattern; for each DRAM block, performing a write of the test data pattern into the DRAM block, performing a pause for a predetermined period of time, and performing a read of a resulting data pattern from the DRAM block; wherein for each DRAM block, the performing the write of the test pattern into the DRAM block is performed before the performing the pause for the predetermined period of time, and the performing the read of the resulting data pattern from the DRAM block is performed after the performing the pause for the predetermined period of time; and wherein at least a portion of the pause for the predetermined period of time of two or more the DRAM blocks overlap in time.