Patents by Inventor William D. Herzog
William D. Herzog has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10605662Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.Type: GrantFiled: February 19, 2019Date of Patent: March 31, 2020Assignee: Massachusetts Institute of TechnologyInventors: Thomas H. Jeys, William D. Herzog, Brian G. Saar, Alexander M. Stolyarov, Ryan Sullenberger, David Crompton, Shawn Michael Redmond
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Publication number: 20190250038Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.Type: ApplicationFiled: February 19, 2019Publication date: August 15, 2019Inventors: Thomas H. Jeys, William D. Herzog, Brian G. Saar, Alexander M. Stolyarov, Ryan Sullenberger, David Crompton, Shawn Michael Redmond
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Patent number: 10228284Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.Type: GrantFiled: June 20, 2016Date of Patent: March 12, 2019Assignee: Massachusetts Institute of TechnologyInventors: Thomas H. Jeys, William D. Herzog, Brian G. Saar, Alexander M. Stolyarov, Ryan Sullenberger, David Crompton, Shawn Michael Redmond
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Publication number: 20170211977Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.Type: ApplicationFiled: June 20, 2016Publication date: July 27, 2017Inventors: Thomas H. Jeys, William D. Herzog, Brian G. Saar, Alexander M. Stolyarov, Ryan Sullenberger, David Crompton, Shawn Michael Redmond
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Patent number: 9594011Abstract: Physical property determination of a particle or classification of the particle as a function of the physical property by evaluating scattered light profile from a single particle is disclosed. The particle may include chemical structures that vibrate as a function of a physical property of the particle. The physical property may include an absorptive property of the particle or a chemical composition. From a detected scattered light spectrum, at least two anomalous dispersive regions may be identified. The physical property of the particle may be determined as a function of the at least two regions. A system employing the physical property determination can achieve sensitivities useful for low particle density applications such as detection for biological and chemical agents.Type: GrantFiled: May 21, 2008Date of Patent: March 14, 2017Assignee: Massachusetts Institute of TechnologyInventor: William D. Herzog
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Patent number: 9030659Abstract: A spark-induced breakdown spectroscopy apparatus can have a housing with an inlet and an outlet that define an analyte flow path. A laser can define a laser pathway generally transverse to an intersecting the analyte flow path. A pair of electrodes, which can have insulating shields, can be mounted within the housing and can define a spark path. An optical detection element defines an optical path. The apparatus can be used to identify an aerosolized analyte.Type: GrantFiled: July 23, 2013Date of Patent: May 12, 2015Assignee: Massachusetts Institute of TechnologyInventors: Shane M. Tysk, John P. D'Angelo, William D. Herzog
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Publication number: 20150029505Abstract: A spark-induced breakdown spectroscopy apparatus can have a housing with an inlet and an outlet that define an analyte flow path. A laser can define a laser pathway generally transverse to an intersecting the analyte flow path. A pair of electrodes, which can have insulating shields, can be mounted within the housing and can define a spark path. An optical detection element defines an optical path. The apparatus can be used to identify an aerosolized analyte.Type: ApplicationFiled: July 23, 2013Publication date: January 29, 2015Applicant: Massachusetts Institute of TechnologyInventors: Shane M. Tysk, John P. D'Angelo, William D. Herzog
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Patent number: 8274655Abstract: Particle detection systems configured to identify a particle in a bulk sample volume are less efficient than those configured to measure a single particle. A particle detection system according to an inventive embodiment can identify a particle in a fluid stream. The detection system may employ one or more heating stations. Each heating station may be set to a distinct temperature. The heating stations may include a light source and a light detector, such that once a particle traverses a beam provided by the light source, the light detector may measure resultant optical scattering. Based on the optical scattering with respect to temperature or temperature variation, an identification of the single particle may be obtained, thereby eliminating measurement inaccuracies associated with bulk sample volumes. The particle detection system may detect organic particles among inorganic particles in various fluid flow environments, such as for safety or quality purposes.Type: GrantFiled: February 1, 2010Date of Patent: September 25, 2012Assignee: Massachusetts Institute of TechnologyInventor: William D. Herzog
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Publication number: 20100220323Abstract: Particle detection systems configured to identify a particle included in a bulk sample volume are less efficient than if measurements are to be taken of a single particle. An embodiment of a particle detection system according to an embodiment of the present invention capable of determining an identification of a particle in a fluid stream is presented. The detection system may employ one or any number of heating stations. Each heating station may be set to a distinct temperature. The heating stations may include a light source and a light detector, such that once a particle traverses a beam provided by the light source, the light detector may measure resultant optical scattering. Based on the optical scattering with respect to temperature or temperature variation, an identification of the single particle may be obtained, thereby eliminating measurement inaccuracies associated with bulk sample volumes.Type: ApplicationFiled: February 1, 2010Publication date: September 2, 2010Applicant: Massachusetts Institute of TechnologyInventor: William D. Herzog
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Patent number: 7772579Abstract: Particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the various portions of the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.Type: GrantFiled: May 18, 2007Date of Patent: August 10, 2010Assignee: Massachusetts Institute of TechnologyInventors: William D. Herzog, Antonio Sanchez-Rubio, Gregory G. Cappiello, Ronald H. Hoffeld, Shane M. Tysk, Vincenzo Daneu, Thomas H. Jeys
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Publication number: 20090316138Abstract: Physical property determination of a particle or classification of the particle as a function of the physical property by evaluating scattered light profile from a single particle is disclosed. The particle may include chemical structures that vibrate as a function of a physical property of the particle. The physical property may include an absorptive property of the particle or a chemical composition. From a detected scattered light spectrum, at least two anomalous dispersive regions may be identified. The physical property of the particle may be determined as a function of the at least two regions. A system employing the physical property determination can achieve sensitivities useful for low particle density applications such as detection for biological and chemical agents.Type: ApplicationFiled: May 21, 2008Publication date: December 24, 2009Inventor: William D. Herzog