Patents by Inventor William Davies, JR.

William Davies, JR. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ranking defects with yield impacts
    Patent number: 10191107
    Abstract: Failure types that caused defective items to fail testing are identified, the defective items are grouped by the failure types to produce failure-type groups, and the defective items are analyzed to identify defect types that caused the failures. Failure-type limited yield within each of the failure-type groups, and failure-type group-specific defect ratio based on proportions of the defect types within each of the failure-type groups are determined. Additionally, each failure-type group-specific defect ratio is weighted using the failure-type limited yield to produce a weighted failure-type group-specific defect limited yield. For each of the defect types, the weighted failure-type group-specific defect limited yield from each of the failure-type groups is combined to produce the failure-type influenced defect-type total limited yield. Matrix processing is used for the weighting and combination processes. The defect types are ranked based on the failure-type influenced defect-type total limited yield.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: January 29, 2019
    Assignee: GLOBALFOUNDRIES INC.
    Inventors: Zhigang Song, Qian Xu, William Davies, Jr.
  • RANKING DEFECTS WITH YIELD IMPACTS
    Publication number: 20180238958
    Abstract: Failure types that caused defective items to fail testing are identified, the defective items are grouped by the failure types to produce failure-type groups, and the defective items are analyzed to identify defect types that caused the failures. Failure-type limited yield within each of the failure-type groups, and failure-type group-specific defect ratio based on proportions of the defect types within each of the failure-type groups are determined. Additionally, each failure-type group-specific defect ratio is weighted using the failure-type limited yield to produce a weighted failure-type group-specific defect limited yield. For each of the defect types, the weighted failure-type group-specific defect limited yield from each of the failure-type groups is combined to produce the failure-type influenced defect-type total limited yield. Matrix processing is used for the weighting and combination processes. The defect types are ranked based on the failure-type influenced defect-type total limited yield.
    Type: Application
    Filed: February 23, 2017
    Publication date: August 23, 2018
    Applicant: GLOBALFOUNDRIES INC.
    Inventors: Zhigang Song, Qian Xu, William Davies, JR.