Abstract: Certain embodiments of the invention may include systems, methods, and apparatus for providing connection fault self-monitoring with DC bias current. According to an example embodiment of the invention, a method is provided for obtaining measurements and detecting connectivity faults associated with a voltage mode sensor. The method can include coupling a DC bias current into a circuit. The circuit includes a voltage mode sensor, and the voltage mode sensor can output a time varying signal. The method can also include setting a nominal level of the DC bias current, monitoring a voltage associated with the DC bias current, and determining circuit connectivity status based at least in part on monitoring the voltage.

Abstract: Certain embodiments of the invention may include systems, methods, and apparatus for providing connection fault self-monitoring with DC bias current. According to an example embodiment of the invention, a method is provided for obtaining measurements and detecting connectivity faults associated with a voltage mode sensor. The method can include coupling a DC bias current into a circuit. The circuit includes a voltage mode sensor, and the voltage mode sensor can output a time varying signal. The method can also include setting a nominal level of the DC bias current, monitoring a voltage associated with the DC bias current, and determining circuit connectivity status based at least in part on monitoring the voltage.

Abstract: A voltage transient suppression circuit for power electronic circuits comprising: a snubber circuit having a resistor and a first and second capacitive element connected in series with a switching power semiconductor; and a sensing logic device connected in parallel with the snubber circuit; the logic circuit being configured to receive voltage signals indicative of said first and second capacitive elements.