Patents by Inventor William E. Vanderlinde

William E. Vanderlinde has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sample-stage for scanning electron microscope
    Patent number: 6777678
    Abstract: The present invention is a sample-stage for a scanning electron microscope. The sample-stage has a base and a horizontal support member, where there is an aperture in the horizontal support member. A vertical support member abuts the base on one end and the horizontal support member on the other end so that the vertical support member is under, and at an angle to, the aperture in the horizontal support member. A collimator, having an aperture in alignment with the aperture in the horizontal support member, abuts the top of the horizontal support member. A first reflector abuts the surface of the vertical support member under the aperture in the horizontal support. A second reflector abuts a portion of the top surface of the base that is not covered by the vertical support member.
    Type: Grant
    Filed: September 17, 2003
    Date of Patent: August 17, 2004
    Assignee: The United States of America as represented by the National Security Agency
    Inventor: William E. Vanderlinde