Patents by Inventor William Ernest Lee
William Ernest Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20250052561Abstract: A method for assessing the profile of a tool using a non-contact tool setting apparatus that includes a transmitter for emitting a light beam and a receiver for receiving the beam. The receiver generates a beam intensity signal describing the intensity of received light. The setting apparatus is mounted to a coordinate positioning apparatus that allows the tool to be moved relative to the setting apparatus. The method includes using the coordinate positioning apparatus to move the tool relative to the setting apparatus along a tool inspection path, the tool inspection path being selected so that the light beam is traced substantially along a periphery of the tool to be inspected. Beam intensity data is collected describing the beam intensity signal that is generated by the receiver as the tool inspection path is traversed and analysis of the collected beam intensity data is used to assess the tool profile.Type: ApplicationFiled: October 28, 2024Publication date: February 13, 2025Applicant: RENISHAW PLCInventors: William Ernest LEE, Paul MAXTED
-
Patent number: 12152872Abstract: A method for assessing the profile of a tool using a non-contact tool setting apparatus that includes a transmitter for emitting a light beam and a receiver for receiving the beam. The receiver generates a beam intensity signal describing the intensity of received light. The setting apparatus is mounted to a coordinate positioning apparatus that allows the tool to be moved relative to the setting apparatus. The method includes using the coordinate positioning apparatus to move the tool relative to the setting apparatus along a tool inspection path, the tool inspection path being selected so that the light beam is traced substantially along a periphery of the tool to be inspected. Beam intensity data is collected describing the beam intensity signal that is generated by the receiver as the tool inspection path is traversed and analysis of the collected beam intensity data is used to assess the tool profile.Type: GrantFiled: June 9, 2022Date of Patent: November 26, 2024Assignee: RENISHAW PLCInventors: William Ernest Lee, Paul Maxted
-
Patent number: 11904426Abstract: A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.Type: GrantFiled: October 27, 2022Date of Patent: February 20, 2024Assignee: RENISHAW PLCInventors: Julian Alexander Cluff, Graham Richard Ferguson, Harry Alan Leafe, William Ernest Lee
-
Publication number: 20230046452Abstract: A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.Type: ApplicationFiled: October 27, 2022Publication date: February 16, 2023Applicant: RENISHAW PLCInventors: Julian Alexander CLUFF, Graham Richard FERGUSON, Harry Alan LEAFE, William Ernest LEE
-
Patent number: 11511384Abstract: A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.Type: GrantFiled: October 7, 2019Date of Patent: November 29, 2022Assignee: RENISHAW PLCInventors: Julian Alexander Cluff, Graham Richard Ferguson, Harry Alan Leafe, William Ernest Lee
-
Publication number: 20220316859Abstract: A method for assessing the profile of a tool using a non-contact tool setting apparatus that includes a transmitter for emitting a light beam and a receiver for receiving the beam. The receiver generates a beam intensity signal describing the intensity of received light. The setting apparatus is mounted to a coordinate positioning apparatus that allows the tool to be moved relative to the setting apparatus. The method includes using the coordinate positioning apparatus to move the tool relative to the setting apparatus along a tool inspection path, the tool inspection path being selected so that the light beam is traced substantially along a periphery of the tool to be inspected. Beam intensity data is collected describing the beam intensity signal that is generated by the receiver as the tool inspection path is traversed and analysis of the collected beam intensity data is used to assess the tool profile.Type: ApplicationFiled: June 9, 2022Publication date: October 6, 2022Applicant: RENISHAW PLCInventors: William Ernest LEE, Paul MAXTED
-
Patent number: 11371830Abstract: A method for assessing the profile of a tool using a non-contact tool setting apparatus that includes a transmitter for emitting a light beam and a receiver for receiving the beam. The receiver generates a beam intensity signal describing the intensity of received light. The setting apparatus is mounted to a coordinate positioning apparatus that allows the tool to be moved relative to the setting apparatus. The method includes using the coordinate positioning apparatus to move the tool relative to the setting apparatus along a tool inspection path, the tool inspection path being selected so that the light beam is traced substantially along a periphery of the tool to be inspected. Beam intensity data is collected describing the beam intensity signal that is generated by the receiver as the tool inspection path is traversed and analysis of the collected beam intensity data is used to assess the tool profile.Type: GrantFiled: August 31, 2018Date of Patent: June 28, 2022Assignee: RENISHAW PLCInventors: William Ernest Lee, Paul Maxted
-
Publication number: 20210347003Abstract: A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.Type: ApplicationFiled: October 7, 2019Publication date: November 11, 2021Applicant: RENISHAW PLCInventors: Julian Alexander CLUFF, Graham Richard FERGUSON, Harry Alan LEAFE, William Ernest LEE
-
Publication number: 20200309509Abstract: A method for assessing the profile of a tool using a non-contact tool setting apparatus that includes a transmitter for emitting a light beam and a receiver for receiving the beam. The receiver generates a beam intensity signal describing the intensity of received light. The setting apparatus is mounted to a coordinate positioning apparatus that allows the tool to be moved relative to the setting apparatus. The method includes using the coordinate positioning apparatus to move the tool relative to the setting apparatus along a tool inspection path, the tool inspection path being selected so that the light beam is traced substantially along a periphery of the tool to be inspected. Beam intensity data is collected describing the beam intensity signal that is generated by the receiver as the tool inspection path is traversed and analysis of the collected beam intensity data is used to assess the tool profile.Type: ApplicationFiled: August 31, 2018Publication date: October 1, 2020Applicant: RENISHAW PLCInventors: William Ernest LEE, Paul MAXTED
-
Patent number: 7525665Abstract: A polarising double-passed interferometer comprises a polarising beamsplitter (16), a reference mirror (20) in the path of a reference beam (14) and a movable measurement mirror (26) in the path of a measurement beam (12). The reference and measurement beams have different polarisations. An angular beam deflection device such a glass wedge or prism (32) acts to remove or separate out an error beam (30) caused by leakage of light of one polarisation into the path of light of the other polarisation.Type: GrantFiled: May 11, 2005Date of Patent: April 28, 2009Assignee: Renishaw PLCInventor: William Ernest Lee
-
Patent number: 7315380Abstract: A laser interferometer is disclosed comprising a housing capable of being substantially repeatably mounted to a wall of an environmental chamber, the housing including a laser source, a reflector attached to an object located within the environmental chamber, and a light passage provided through the wall of the environmental chamber enabling passage of a laser beam from the laser source to the reflector. At least one beam steerer may be provided for adjusting direction of passage of a laser beam through the light passage. Also disclosed is a column laser interferometer.Type: GrantFiled: March 24, 2005Date of Patent: January 1, 2008Assignee: Renishaw, PLCInventors: Mark Adrian Vincent Chapman, William Ernest Lee, Martin Jonathan May
-
Patent number: 7304815Abstract: A laser system and interferometer are disclosed comprising a laser source for generating a laser beam, and first and second adjustable elements wherein the first and second adjustable elements have limited rotational motion so rotation of the first adjustable element causes deviation of a laser beam in one plane and rotation of the second adjustable element causes deviation in a second plane, and a laser beam from the laser source is oblique to a required beam direction whereby rotation of the adjustable elements deviates the laser beam enabling alignment of the laser beam to the required beam direction. The adjustable elements may be rotatable through 90°. The first and second planes may be perpendicular to the required beam direction and to each other. At least one mirror may be provided which can be angularly offset to the required beam direction.Type: GrantFiled: October 3, 2003Date of Patent: December 4, 2007Assignee: Renishaw, PLCInventors: Mark Adrian Vincent Chapman, William Ernest Lee, Tingdi Liao