Abstract: A device, integrated circuit and method for generating simulated errors are disclosed. In the disclosed device, integrated circuit and method, an original data value is read from a memory. The original data value is intercepted by the integrated circuit. The integrated circuit is operable to virtualize an error in the original data value to generate a modified data value. The integrated circuit is also operable to generate an interrupt according to the virtualization. This disclosure may be particularly useful for high-level memory validation.

Abstract: A device, integrated circuit and method for generating simulated errors are disclosed. In the disclosed device, integrated circuit and method, an original data value is read from a memory. The original data value is intercepted by the integrated circuit. The integrated circuit is operable to virtualize an error in the original data value to generate a modified data value. The integrated circuit is also operable to generate an interrupt according to the virtualization. This disclosure may be particularly useful for high-level memory validation.

Abstract: Embodiments of the invention enable error simulation for system validation. Errors can be simulated by modifying data presented to the processor as well as generating interrupts consistent with the modified data in the ASIC hardware. Modify logic may be added to the ASIC so when the microprocessor attempts to read a specific address, the modify logic may mask one or more of the data bits returned by the requested address. Address, bit mask, and force value data may be stored in registers to determine which address may be modified, the bit location to be modified, and the value that bit location should be changed to. Selection logic may then determine whether data from the modify logic or the unmodified value from an attached device should be sent to the ASIC interface and on to the microprocessor. A timer may also be used to decouple the setup from the test.

Abstract: Embodiments of the invention enable error simulation for system validation. Errors can be simulated by modifying data presented to the processor as well as generating interrupts consistent with the modified data in the ASIC hardware. Modify logic may be added to the ASIC so when the microprocessor attempts to read a specific address, the modify logic may mask one or more of the data bits returned by the requested address. Address, bit mask, and force value data may be stored in registers to determine which address may be modified, the bit location to be modified, and the value that bit location should be changed to. Selection logic may then determine whether data from the modify logic or the unmodified value from an attached device should be sent to the ASIC interface and on to the microprocessor. A timer may also be used to decouple the setup from the test.

Abstract: This invention relates to error simulation for system validation. Errors can be simulated by modifying data presented to the processor as well as generating interrupts consistent with the modified data in the ASIC hardware. Modify logic may be added to the ASIC so when the microprocessor attempts to read a specific address, the modify logic may mask one or more of the data bits returned by the requested address. Address, bit mask, and force value data may be stored in registers to determine which address may be modified, the bit location to be modified, and the value that bit location should be changed to. Selection logic may then determine whether data from the modify logic or the unmodified value from an attached device should be sent to the ASIC interface and on to the microprocessor. A timer may also be used to decouple the setup from the test.

Abstract: Embodiments of the invention enable error simulation for system validation. Errors can be simulated by modifying data presented to the processor as well as generating interrupts consistent with the modified data in the ASIC hardware. Modify logic may be added to the ASIC so when the microprocessor attempts to read a specific address, the modify logic may mask one or more of the data bits returned by the requested address. Address, bit mask, and force value data may be stored in registers to determine which address may be modified, the bit location to be modified, and the value that bit location should be changed to. Selection logic may then determine whether data from the modify logic or the unmodified value from an attached device should be sent to the ASIC interface and on to the microprocessor. A timer may also be used to decouple the setup from the test.