Patents by Inventor William F. Hug
William F. Hug has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11448598Abstract: Methods, apparatus, and systems provide improved identification of selected biohazard and/or biohazard signatures from complex in vivo or in vitro samples and include deep UV native fluorescence spectroscopic analysis for multiple locations of a sample wherein classification results for individual locations are combined and spatially correlated to provide a positive or negative conclusion of biohazard signature presence (e.g., for signatures for viruses, bacteria, and diseases including SARS-CoV-2 and its variants and COVID-19 and its variants). Improvements include one or more of reduced sample processing time (minutes to fractions of a minute), reduced sampling cost (dollars to fractions of a dollar), high conclusion reliability (rivaling real time RT-PCR). Some embodiments may incorporate a stage or scanning mirror system to provide movement of a sample relative to an excitation exposure location. Some embodiments may incorporate Raman or phosphorescence spectroscopic analysis as well as imaging systems.Type: GrantFiled: July 13, 2021Date of Patent: September 20, 2022Assignee: Photon Systems, Inc.Inventors: Rohit Bhartia, Michael R. Reid, William F. Hug, Ray D. Reid
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Patent number: 11262301Abstract: Naphthalene, benzene, toluene, xylene, and other volatile organic compounds VOCs have been identified as serious health hazards. Embodiments of the invention are directed to methods and apparatus for near-real-time in-situ detection and accumulated dose measurement of exposure to naphthalene vapor and other hazardous gaseous VOCs. The methods and apparatus employ excitation of fluorophors native or endogenous to compounds of interest using light sources emitting in the ultraviolet below 300 nm and measurement of native fluorescence emissions in distinct wavebands above the excitation wavelength. The apparatus of some embodiments are cell-phone-sized sensor/dosimeter “badges” to be worn by personnel potentially exposed to hazardous VOCs. The badge sensor of some embodiments provides both real time detection and data logging of exposure to naphthalene or other VOCs of interest from which both instantaneous and accumulated dose can be determined.Type: GrantFiled: September 4, 2020Date of Patent: March 1, 2022Assignee: Photon Systems, Inc.Inventors: William F. Hug, Rohit Bhartia, Ray D. Reid, Arthur L. Lane
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Patent number: 10895533Abstract: Naphthalene, benzene, toluene, xylene, and other volatile organic compounds VOCs have been identified as serious health hazards. Embodiments of the invention are directed to methods and apparatus for near-real-time in-situ detection and accumulated dose measurement of exposure to naphthalene vapor and other hazardous gaseous VOCs. The methods and apparatus employ excitation of fluorophors native or endogenous to compounds of interest using light sources emitting in the ultraviolet below 300 nm and measurement of native fluorescence emissions in distinct wavebands above the excitation wavelength. The apparatus of some embodiments are cell-phone-sized sensor/dosimeter “badges” to be worn by personnel potentially exposed to hazardous VOCs. The badge sensor of some embodiments provides both real time detection and data logging of exposure to naphthalene or other VOCs of interest from which both instantaneous and accumulated dose can be determined.Type: GrantFiled: March 16, 2020Date of Patent: January 19, 2021Assignee: Photon Systems, Inc.Inventors: William F. Hug, Röhit Bhartia, Ray D. Reid, Arthur L. Lane
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Patent number: 10890533Abstract: Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification. In some embodiments Raman analysis is conducted along with photoluminescence spectroscopy (i.e. fluorescence and/or phosphorescence spectroscopy) to provide high levels of sensitivity and specificity in the same instrument.Type: GrantFiled: November 19, 2019Date of Patent: January 12, 2021Assignee: Photon Systems, Inc.Inventors: William F. Hug, Ray D. Reid, Rohit Bhartia, Arthur L. Lane
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Patent number: 10753863Abstract: Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification. In some embodiments Raman analysis is conducted along with photoluminescence spectroscopy (i.e. fluorescence and/or phosphorescence spectroscopy) to provide high levels of sensitivity and specificity in the same instrument.Type: GrantFiled: November 19, 2019Date of Patent: August 25, 2020Assignee: Photon Systems, Inc.Inventors: William F. Hug, Ray D. Reid, Rohit Bhartia, Arthur L. Lane
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Patent number: 10598596Abstract: Naphthalene, benzene, toluene, xylene, and other volatile organic compounds VOCs have been identified as serious health hazards. Embodiments of the invention are directed to methods and apparatus for near-real-time in-situ detection and accumulated dose measurement of exposure to naphthalene vapor and other hazardous gaseous VOCs. The methods and apparatus employ excitation of fluorophors native or endogenous to compounds of interest using light sources emitting in the ultraviolet below 300 nm and measurement of native fluorescence emissions in distinct wavebands above the excitation wavelength. The apparatus of some embodiments are cell-phone-sized sensor/dosimeter “badges” to be worn by personnel potentially exposed to hazardous VOCs. The badge sensor of some embodiments provides both real time detection and data logging of exposure to naphthalene or other VOCs of interest from which both instantaneous and accumulated dose can be determined.Type: GrantFiled: March 22, 2019Date of Patent: March 24, 2020Assignee: Photon Systems, Inc.Inventors: William F. Hug, Rohit Bhartia, Ray D. Reid, Arthur L. Lane
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Patent number: 9915603Abstract: Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification. In some embodiments Raman analysis is conducted along with photoluminescence spectroscopy (i.e. fluorescence and/or phosphorescence spectroscopy) to provide high levels of sensitivity and specificity in the same instrument.Type: GrantFiled: February 14, 2017Date of Patent: March 13, 2018Assignee: Photon Systems, Inc.Inventors: William F. Hug, Ray D. Reid, Rohit Bhartia, Arthur L. Lane
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Patent number: 9909990Abstract: Naphthalene, benzene, toluene, xylene, and other volatile organic compounds VOCs have been identified as serious health hazards. Embodiments of the invention are directed to methods and apparatus for near-real-time in-situ detection and accumulated dose measurement of exposure to naphthalene vapor and other hazardous gaseous VOCs. The methods and apparatus employ excitation of fluorophors native or endogenous to compounds of interest using light sources emitting in the ultraviolet below 300 nm and measurement of native fluorescence emissions in distinct wavebands above the excitation wavelength. The apparatus of some embodiments are cell-phone-sized sensor/dosimeter “badges” to be worn by personnel potentially exposed to hazardous VOCs. The badge sensor of some embodiments provides both real time detection and data logging of exposure to naphthalene or other VOCs of interest from which both instantaneous and accumulated dose can be determined.Type: GrantFiled: September 12, 2016Date of Patent: March 6, 2018Assignee: Photon Systems, Inc.Inventors: William F. Hug, Rohit Bhartia, Ray D. Reid, Arthur L. Lane
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Patent number: 9568418Abstract: Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification. In some embodiments Raman analysis is conducted along with photoluminescence spectroscopy (i.e. fluorescence and/or phosphorescence spectroscopy) to provide high levels of sensitivity and specificity in the same instrument.Type: GrantFiled: June 24, 2014Date of Patent: February 14, 2017Assignee: Photon Systems, Inc.Inventors: William F. Hug, Ray D. Reid, Rohit Bhartia, Arthur L. Lane
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Patent number: 9442070Abstract: Naphthalene, benzene, toluene, xylene, and other volatile organic compounds VOCs have been identified as serious health hazards. Embodiments of the invention are directed to methods and apparatus for near-real-time in-situ detection and accumulated dose measurement of exposure to naphthalene vapor and other hazardous gaseous VOCs. The methods and apparatus employ excitation of fluorophors native or endogenous to compounds of interest using light sources emitting in the ultraviolet below 300 nm and measurement of native fluorescence emissions in distinct wavebands above the excitation wavelength. The apparatus of some embodiments are cell-phone-sized sensor/dosimeter “badges” to be worn by personnel potentially exposed to hazardous VOCs. The badge sensor of some embodiments provides both real time detection and data logging of exposure to naphthalene or other VOCs of interest from which both instantaneous and accumulated dose can be determined.Type: GrantFiled: June 24, 2014Date of Patent: September 13, 2016Assignee: Photon Systems, Inc.Inventors: William F. Hug, Rohit Bhartia, Ray D. Reid, Arthur L. Lane
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Patent number: 8759791Abstract: Naphthalene, benzene, toluene, xylene, and other volatile organic compounds have been identified as serious health hazards. This is especially true for personnel working with JP8 jet fuel and other fuels containing naphthalene as well as other hazardous volatile organic compounds (VOCs). Embodiments of the invention are directed to methods and apparatus for near-real-time in-situ detection and accumulated dose measurement of exposure to naphthalene vapor and other hazardous gaseous VOCs. The methods and apparatus employ excitation of fluorophors native or endogenous to compounds of interest using light sources emitting in the ultraviolet below 300 nm and measurement of native fluorescence emissions in distinct wavebands above the excitation wavelength. The apparatus of some embodiments are cell-phone-sized sensor/dosimeter “badges” to be worn by personnel potentially exposed to naphthalene or other hazardous VOCs.Type: GrantFiled: November 30, 2009Date of Patent: June 24, 2014Assignee: Photon Systems, Inc.Inventors: William F. Hug, Rohit Bhartia, Ray D. Reid, Arthur L. Lane
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Patent number: 8395770Abstract: Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. Chemical analysis instruments employed in some embodiments include capillary and gel plane electrophoresis, capillary electrochromatography, high performance liquid chromatography, flow cytometry, flow cells for liquids and aerosols, and surface detection instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification.Type: GrantFiled: August 21, 2009Date of Patent: March 12, 2013Assignee: Photon SystemsInventors: William F. Hug, Ray D. Reid, Rohit Bhartia
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Patent number: 7800753Abstract: Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. Chemical analysis instruments employed in some embodiments include capillary and gel plane electrophoresis, capillary electrochromatography, high performance liquid chromatography, flow cytometry, flow cells for liquids and aerosols, and surface detection instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification.Type: GrantFiled: March 6, 2009Date of Patent: September 21, 2010Assignee: Photon SystemsInventors: William F. Hug, Ray D. Reid
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Patent number: 7590161Abstract: Electron-beam-pumped semiconductor ultra-violet optical sources (ESUVOSs) are disclosed that use ballistic electron pumped wide bandgap semiconductor materials. The sources may produce incoherent radiation and take the form of electron-beam-pumped light emitting triodes (ELETs). The sources may produce coherent radiation and take the form of electron-beam-pumped laser triodes (ELTs). The ELTs may take the form of electron-beam-pumped vertical cavity surface emitting lasers (EVCSEL) or edge emitting electron-beam-pumped lasers (EEELs). The semiconductor medium may take the form of an aluminum gallium nitride alloy that has a mole fraction of aluminum selected to give a desired emission wavelength, diamond, or diamond-like carbon (DLC). The sources may be produced from discrete components that are assembled after their individual formation or they may be produced using batch MEMS-type or semiconductor-type processing techniques to build them up in a whole or partial monolithic manner, or combination thereof.Type: GrantFiled: October 5, 2005Date of Patent: September 15, 2009Assignee: Photon SystemsInventors: William F. Hug, Ray D. Reid
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Patent number: 7525653Abstract: Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. Chemical analysis instruments employed in some embodiments include capillary and gel plane electrophoresis, capillary electrochromatography, high performance liquid chromatography, flow cytometry, flow cells for liquids and aerosols, and surface detection instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification.Type: GrantFiled: October 5, 2005Date of Patent: April 28, 2009Assignee: Photon SystemsInventors: William F. Hug, Ray D. Reid
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Patent number: 6693944Abstract: Internal mirror sputtering metal ion lasers are disclosed which employ laser mirrors and a resonator internal to and integral with the laser plasma tube. Preferred lasers use silver, copper, gold and other metals individually or in combination as optically active materials and buffer gases of helium, neon, argon and other noble gases. Laser mirrors are utilized to enhance or reject selected combinations of emission wavelengths. Because of the rapid response time of these lasers, they may be employed as quasi-CW devices with laser output pulse widths ranging from a few microseconds to hundreds of microseconds and with very low input power ranging from a few watts to about 500 watts. The disclosed lasers approach the size, weight, power consumption, and cost of a helium-neon laser while providing quasi-continuous output up to hundreds of milliwatts at a wide range of wavelengths from about 200nm in the deep ultraviolet to about 2000nm in the middle infrared.Type: GrantFiled: February 17, 1999Date of Patent: February 17, 2004Inventors: William F. Hug, Ray D. Reid
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Patent number: 6532100Abstract: Solid state lasers that use non-linear optical crystals to generate frequency tripled or quadrupled output in the ultraviolet have low lifetimes due to damage to the face of the non-linear crystal through which the ultraviolet signal exits. To prevent this damage, the tripling or quadrupling crystal is provided within a controlled environment that is maintained substantially free from contaminants such as silicon-bearing and organic compounds. The tripling or quadrupling crystal is enclosed within a tubular chamber with windows on the ends of the tube that provide optical access to the entrance and exit faces of the tripling or quadrupling crystal. All heating elements and alignment elements for the crystal are outside of the chamber. Because the crystal is stored within the hermetically sealed chamber, contaminants are not available within the environment of the crystal that could interact with the energetic photons of the ultraviolet output of the frequency multiplied solid state laser.Type: GrantFiled: August 4, 1999Date of Patent: March 11, 2003Assignee: 3D Systems, Inc.Inventors: Jouni P. Partanen, Xingkun Wu, Gary Reynolds, William F. Hug
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Patent number: 6347101Abstract: A solid state laser includes a high absorption coefficient solid state gain medium such as Nd:YVO4 that is side pumped with a semiconductor laser diode array. The resonant cavity of the solid state laser is positioned so that the TEM00 mode is spaced from the face of the laser through which the laser is pumped by a distance sufficient to reduce diffraction losses but sufficiently near to allow coupling of pump light into the gain mode. The gain medium, the doping level of the gain medium, and the operating temperature of the pump laser are selected to efficiently couple pump light into the gain mode. The pump laser is positioned to side pump the gain medium without collimating or focusing optics between the pump laser and the face of the gain medium. A gap between the pump laser and the gain medium is empirically selected to match the angular extent of the pump laser output light to the height of the gain mode at the position of the gain mode fixed to optimize coupling and diffraction losses.Type: GrantFiled: April 16, 1998Date of Patent: February 12, 2002Assignee: 3D Systems, Inc.Inventors: Xingkun Wu, Jouni P. Partanen, William F. Hug, Hamid Hemmati
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Patent number: 6287869Abstract: Internal mirror sputtering metal ion lasers are disclosed which employ laser mirrors and a resonator internal to and integral with the laser plasma tube. Preferred lasers use silver, copper, gold and other metals individually or in combination as optically active materials and buffer gases of helium, neon, argon and other noble gases. Laser mirrors are utilized to enhance or reject selected combinations of emission wavelengths. Because of the rapid response time of these lasers, they may be employed as quasi-CW devices with laser output pulse widths ranging from a few microseconds to hundreds of microseconds and with very low input power ranging from a few watts to about 500 watts. The disclosed lasers approach the size, weight, power consumption, and cost of a helium-neon laser while providing quasi-continuous output up to hundreds of milliwatts at a wide range of wavelengths from about 200 nm in the deep ultraviolet to about 2000 nm in the middle infrared.Type: GrantFiled: February 17, 1999Date of Patent: September 11, 2001Inventors: William F. Hug, Ray D. Reid
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Patent number: 6200005Abstract: A xenon ceramic lamp comprising a short-arc lamp with two integral reflectors disposed around the cathode arc ball to collect a wide range of elevation angles of light relative to the center longitudinal axis. The two integral reflectors and the cathode arc ball are within the same sealed volume of the lamp. A first reflector, generally below a common first focus, is a concave elliptical type for projecting light out through a sapphire window to a second focus. A second reflector, generally above the first focus, is a concave spherical type having its focus just offset from the first focus. Therefore, light rays may be emitted at nearly all angles from the cathode arc ball that will be reflected or back reflected by the elliptical and spherical reflectors.Type: GrantFiled: December 1, 1998Date of Patent: March 13, 2001Assignee: ILC Technology, Inc.Inventors: Roy D. Roberts, William F. Hug